Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples

Mikhail Lyubomirskiy, Felix Wittwer, Maik Kahnt, Frieder Koch, Adam Kubec, Ken Vidar Falch, Jan Garrevoet, Martin Seyrich, Christian David, Christian G. Schroer

Research output: Contribution to journal › Article › peer-review

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Physics