Multi-scale investigation of interface properties, stacking order and decoupling of few layer graphene on C-face 4H-SiC

C. Bouhafs, A. A. Zakharov, Ivan G. Ivanov, F. Giannazzo, J. Eriksson, V. Stanishev, P. Kühne, T. Iakimov, T. Hofmann, M. Schubert, F. Roccaforte, R Yakimova, V. Darakchieva

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Multi-scale investigation of interface properties, stacking order and decoupling of few layer graphene on C-face 4H-SiC'. Together they form a unique fingerprint.

Engineering

Material Science