Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses

Frank Seiboth, Felix Wittwer, Maria Scholz, Maik Kahnt, Martin Seyrich, Andreas Schropp, Ulrich Wagner, Christoph Rau, Jan Garrevoet, Gerald Falkenberg, Christian G. Schroer

Research output: Contribution to journalArticlepeer-review

6 Citations (SciVal)

Abstract

Wavefront errors of rotationally parabolic refractive X-ray lenses made of beryllium (Be CRLs) have been recovered for various lens sets and X-ray beam configurations. Due to manufacturing via an embossing process, aberrations of individual lenses within the investigated ensemble are very similar. By deriving a mean single-lens deformation for the ensemble, aberrations of any arbitrary lens stack can be predicted from the ensemble with = 0.034λ. Using these findings the expected focusing performance of current Be CRLs are modeled for relevant X-ray energies and bandwidths and it is shown that a correction of aberrations can be realised without prior lens characterization but simply based on the derived lens deformation. The performance of aberration-corrected Be CRLs is discussed and the applicability of aberration-correction demonstrated over wide X-ray energy ranges.The recovery of wavefront distortions over multiple compound refractive optics was used to model and correct aberrations of similar individual Be lenses for different X-ray energies and focal lengths.

Original languageEnglish
Pages (from-to)108-115
Number of pages8
JournalJournal of Synchrotron Radiation
Volume25
Issue number1
DOIs
Publication statusPublished - 2018 Jan 1
Externally publishedYes

Bibliographical note

Erratum: https://doi.org/10.1107/S1600577521003167

Subject classification (UKÄ)

  • Atom and Molecular Physics and Optics

Keywords

  • aberration correction
  • phase plate
  • ptychography
  • Refractive X-Ray optics

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