No Fault Found: The Root Cause

Erik Larsson; Bill Eklow; Scott Davidsson; Rob Aitken; Artur Jutman; Christophe Lotz

doi:10.1109/VTS.2015.7116284

No Fault Found: The Root Cause

Erik Larsson, Bill Eklow, Scott Davidsson, Rob Aitken, Artur Jutman, Christophe Lotz

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

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Abstract

No Trouble Found (NTF) has been discussed for several years [1]. An NTF occurs when a device fails at the board/system level and that failure cannot be confirm by the component supplier. There are several explanations for why NTFs occur, including: device complexity; inability to create system level hardware/software transactions which uncover hard to find defects; different environments during testing (power, thermal, noise). More recently a new concept, No Fault Found (NFF), has emerged. A NFF represents a defect which cannot be detected by any known means so far. The premise is that at some point the defect will be exposed - most likely at a customer site when the device is in a system. Given that we looking for a defect that we know nothing about and are theoretically undetectable it will be interesting to see what the panel has to say about the nature of these defects and how we intend to find them.

Original language	English
Title of host publication	IEEE 33rd VLSI Test Symposium (VTS), 2015
Publisher	IEEE - Institute of Electrical and Electronics Engineers Inc.
Number of pages	1
ISBN (Print)	9781479975983
DOIs	https://doi.org/10.1109/VTS.2015.7116284
Publication status	Published - 2015
Event	IEEE VLSI Test Symposium - Napa, United States Duration: 2015 Apr 27 → …

Conference

Conference	IEEE VLSI Test Symposium
Country/Territory	United States
City	Napa
Period	2015/04/27 → …

Subject classification (UKÄ)

Engineering and Technology

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10.1109/VTS.2015.7116284

vts15

Cite this

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title = "No Fault Found: The Root Cause",

abstract = "No Trouble Found (NTF) has been discussed for several years [1]. An NTF occurs when a device fails at the board/system level and that failure cannot be confirm by the component supplier. There are several explanations for why NTFs occur, including: device complexity; inability to create system level hardware/software transactions which uncover hard to find defects; different environments during testing (power, thermal, noise). More recently a new concept, No Fault Found (NFF), has emerged. A NFF represents a defect which cannot be detected by any known means so far. The premise is that at some point the defect will be exposed - most likely at a customer site when the device is in a system. Given that we looking for a defect that we know nothing about and are theoretically undetectable it will be interesting to see what the panel has to say about the nature of these defects and how we intend to find them.",

author = "Erik Larsson and Bill Eklow and Scott Davidsson and Rob Aitken and Artur Jutman and Christophe Lotz",

year = "2015",

doi = "10.1109/VTS.2015.7116284",

language = "English",

isbn = "9781479975983",

booktitle = "IEEE 33rd VLSI Test Symposium (VTS), 2015",

publisher = "IEEE - Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "IEEE VLSI Test Symposium ; Conference date: 27-04-2015",

}

TY - GEN

T1 - No Fault Found: The Root Cause

AU - Larsson, Erik

AU - Eklow, Bill

AU - Davidsson, Scott

AU - Aitken, Rob

AU - Jutman, Artur

AU - Lotz, Christophe

PY - 2015

Y1 - 2015

N2 - No Trouble Found (NTF) has been discussed for several years [1]. An NTF occurs when a device fails at the board/system level and that failure cannot be confirm by the component supplier. There are several explanations for why NTFs occur, including: device complexity; inability to create system level hardware/software transactions which uncover hard to find defects; different environments during testing (power, thermal, noise). More recently a new concept, No Fault Found (NFF), has emerged. A NFF represents a defect which cannot be detected by any known means so far. The premise is that at some point the defect will be exposed - most likely at a customer site when the device is in a system. Given that we looking for a defect that we know nothing about and are theoretically undetectable it will be interesting to see what the panel has to say about the nature of these defects and how we intend to find them.

AB - No Trouble Found (NTF) has been discussed for several years [1]. An NTF occurs when a device fails at the board/system level and that failure cannot be confirm by the component supplier. There are several explanations for why NTFs occur, including: device complexity; inability to create system level hardware/software transactions which uncover hard to find defects; different environments during testing (power, thermal, noise). More recently a new concept, No Fault Found (NFF), has emerged. A NFF represents a defect which cannot be detected by any known means so far. The premise is that at some point the defect will be exposed - most likely at a customer site when the device is in a system. Given that we looking for a defect that we know nothing about and are theoretically undetectable it will be interesting to see what the panel has to say about the nature of these defects and how we intend to find them.

U2 - 10.1109/VTS.2015.7116284

DO - 10.1109/VTS.2015.7116284

M3 - Paper in conference proceeding

SN - 9781479975983

BT - IEEE 33rd VLSI Test Symposium (VTS), 2015

PB - IEEE - Institute of Electrical and Electronics Engineers Inc.

T2 - IEEE VLSI Test Symposium

Y2 - 27 April 2015

ER -

No Fault Found: The Root Cause

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