Abstract
We report on the structural characterization of GaAs nanowires integrated on Si(001) by template-assisted selective epitaxy. The nanowires were grown in lateral SiO2 templates along [110] with varying V/III ratios and temperatures using metal-organic chemical vapor deposition. The nanowires have been categorized depending on the growth facets which typically consisted of (110) and (111)B planes. Nanowires exhibiting a (111)B growth facet were found to have high density planar defects for all growth conditions investigated. However, GaAs nanowires with a single (110) growth facet were grown without the formation of planar stacking faults, resulting in a pure zinc blende crystal.
Original language | English |
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Pages (from-to) | 6297-6302 |
Number of pages | 6 |
Journal | Crystal Growth and Design |
Volume | 17 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2017 Jan 1 |
Subject classification (UKÄ)
- Other Electrical Engineering, Electronic Engineering, Information Engineering