On crystal structure imaging of silicalite by HREM

V. Alfredsson; O. Terasaki; J. O. Bovin

doi:10.1016/0022-4596(90)90196-5

On crystal structure imaging of silicalite by HREM

V. Alfredsson, O. Terasaki, J. O. Bovin

Lund University

Research output: Contribution to journal › Article › peer-review

Abstract

High-resolution electron microscopy (HREM) images of silicalite (ZSM-5) along [010] were taken with a 400-kV EM with a resolution of 1.6 Å. The images contain a dark contrast in the centers of the main channels, where there are no atoms. This contrast is an artifact and is not appreciable in the HREM images which have been published so far. That this problem can be overcome by choosing the proper experimental conditions was confirmed by both computer-simulated and experimental HREM images. Computer image processing is also applicable to this kind of problem.

Original language	English
Pages (from-to)	171-177
Number of pages	7
Journal	Journal of Solid State Chemistry
Volume	84
Issue number	1
DOIs	https://doi.org/10.1016/0022-4596(90)90196-5
Publication status	Published - 1990 Jan 1

Subject classification (UKÄ)

Physical Chemistry (including Surface- and Colloid Chemistry)

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10.1016/0022-4596(90)90196-5

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@article{193189624153436a895935c771a0f6b4,

title = "On crystal structure imaging of silicalite by HREM",

abstract = "High-resolution electron microscopy (HREM) images of silicalite (ZSM-5) along [010] were taken with a 400-kV EM with a resolution of 1.6 {\AA}. The images contain a dark contrast in the centers of the main channels, where there are no atoms. This contrast is an artifact and is not appreciable in the HREM images which have been published so far. That this problem can be overcome by choosing the proper experimental conditions was confirmed by both computer-simulated and experimental HREM images. Computer image processing is also applicable to this kind of problem.",

author = "V. Alfredsson and O. Terasaki and Bovin, \{J. O.\}",

year = "1990",

month = jan,

day = "1",

doi = "10.1016/0022-4596(90)90196-5",

language = "English",

volume = "84",

pages = "171--177",

journal = "Journal of Solid State Chemistry",

issn = "0022-4596",

publisher = "Academic Press",

number = "1",

}

TY - JOUR

T1 - On crystal structure imaging of silicalite by HREM

AU - Alfredsson, V.

AU - Terasaki, O.

AU - Bovin, J. O.

PY - 1990/1/1

Y1 - 1990/1/1

N2 - High-resolution electron microscopy (HREM) images of silicalite (ZSM-5) along [010] were taken with a 400-kV EM with a resolution of 1.6 Å. The images contain a dark contrast in the centers of the main channels, where there are no atoms. This contrast is an artifact and is not appreciable in the HREM images which have been published so far. That this problem can be overcome by choosing the proper experimental conditions was confirmed by both computer-simulated and experimental HREM images. Computer image processing is also applicable to this kind of problem.

AB - High-resolution electron microscopy (HREM) images of silicalite (ZSM-5) along [010] were taken with a 400-kV EM with a resolution of 1.6 Å. The images contain a dark contrast in the centers of the main channels, where there are no atoms. This contrast is an artifact and is not appreciable in the HREM images which have been published so far. That this problem can be overcome by choosing the proper experimental conditions was confirmed by both computer-simulated and experimental HREM images. Computer image processing is also applicable to this kind of problem.

UR - https://www.scopus.com/pages/publications/0040969784

U2 - 10.1016/0022-4596(90)90196-5

DO - 10.1016/0022-4596(90)90196-5

M3 - Article

AN - SCOPUS:0040969784

SN - 0022-4596

VL - 84

SP - 171

EP - 177

JO - Journal of Solid State Chemistry

JF - Journal of Solid State Chemistry

IS - 1

ER -

On crystal structure imaging of silicalite by HREM

Abstract

Subject classification (UKÄ)

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