On the diagnostic analysis of IEEE 1687 networks

R. Cantoro, M. Montazeri, M. Sonza Reorda, F. Ghani Zadegan, E. Larsson

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instruments existing within devices (e.g., to support test, diagnosis, calibration, etc.), by using configuration modules which act as controllable switches. The increasing adoption of this standard requires the availability of algorithms and tools to automate its usage. The resulting networks might be affected by defects preventing their correct operation. This necessitates the availability of solutions which allow not only to test against defects, but also to identify the location of possible faults via diagnosis. This paper for the first time addresses the problem of the diagnosis of IEEE 1687 networks. Experimental results gathered on a set of benchmark networks show the feasibility of the solution and provide a first idea about the length of the required input stimuli.

Original languageEnglish
Title of host publicationProceedings - 2016 21st IEEE European Test Symposium, ETS 2016
PublisherIEEE - Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467396592
DOIs
Publication statusPublished - 2016 Jul 22
Event21st IEEE European Test Symposium, ETS 2016 - Amsterdam, Netherlands
Duration: 2016 May 232016 May 26

Conference

Conference21st IEEE European Test Symposium, ETS 2016
Country/TerritoryNetherlands
CityAmsterdam
Period2016/05/232016/05/26

Subject classification (UKÄ)

  • Electrical Engineering, Electronic Engineering, Information Engineering

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