Abstract
The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instruments existing within devices (e.g., to support test, diagnosis, calibration, etc.), by using configuration modules which act as controllable switches. The increasing adoption of this standard requires the availability of algorithms and tools to automate its usage. The resulting networks might be affected by defects preventing their correct operation. This necessitates the availability of solutions which allow not only to test against defects, but also to identify the location of possible faults via diagnosis. This paper for the first time addresses the problem of the diagnosis of IEEE 1687 networks. Experimental results gathered on a set of benchmark networks show the feasibility of the solution and provide a first idea about the length of the required input stimuli.
Original language | English |
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Title of host publication | Proceedings - 2016 21st IEEE European Test Symposium, ETS 2016 |
Publisher | IEEE - Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781467396592 |
DOIs | |
Publication status | Published - 2016 Jul 22 |
Event | 21st IEEE European Test Symposium, ETS 2016 - Amsterdam, Netherlands Duration: 2016 May 23 → 2016 May 26 |
Conference
Conference | 21st IEEE European Test Symposium, ETS 2016 |
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Country/Territory | Netherlands |
City | Amsterdam |
Period | 2016/05/23 → 2016/05/26 |
Subject classification (UKÄ)
- Electrical Engineering, Electronic Engineering, Information Engineering