On the use of multilayer Laue lenses with X-ray free electron lasers

Mauro Prasciolu; Kevin T. Murray; Nikolay Ivanov; Holger Fleckenstein; Martin Domaracký; Luca Gelisio; Fabian Trost; Kartik Ayyer; Dietrich Krebs; Steve Aplin; Salah Awel; Ulrike Boesenberg; Grega Belšak; Anton Barty; Armando D. Estillore; Matthias Fuchs; Yaroslav Gevorkov; Joerg Hallmann; Chan Kim; Juraj Knoška; Jochen Küpper; Chufeng Li; Wei Lu; Valerio Mariani; Andrew J. Morgan; Johannes Möller; Anders Madsen; Dominik Oberthür; Gisel E.Peña Murillo; David A. Reis; Markus Scholz; Bozidar Šarler; Pablo Villanueva-Perez; Oleksandr Yefanov; Kara A. Zielinski; Alexey Zozulya; Henry N. Chapman; Saša Bajt

doi:10.1117/12.2592229

On the use of multilayer Laue lenses with X-ray free electron lasers

Mauro Prasciolu, Kevin T. Murray, Nikolay Ivanov, Holger Fleckenstein, Martin Domaracký, Luca Gelisio, Fabian Trost, Kartik Ayyer, Dietrich Krebs, Steve Aplin, Salah Awel, Ulrike Boesenberg, Grega Belšak, Anton Barty, Armando D. Estillore, Matthias Fuchs, Yaroslav Gevorkov, Joerg Hallmann, Chan Kim, Juraj KnoškaJochen Küpper, Chufeng Li, Wei Lu, Valerio Mariani, Andrew J. Morgan, Johannes Möller, Anders Madsen, Dominik Oberthür, Gisel E.Peña Murillo, David A. Reis, Markus Scholz, Bozidar Šarler, Pablo Villanueva-Perez, Oleksandr Yefanov, Kara A. Zielinski, Alexey Zozulya, Henry N. Chapman, Saša Bajt

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

Abstract

We report on the use of multilayer Laue lenses to focus the intense X-ray Free Electron Laser (XFEL) beam at the European XFEL to a spot size of a few tens of nanometers. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique X-ray source.

Original language	English
Title of host publication	International Conference on X-Ray Lasers 2020
Editors	Davide Bleiner
Publisher	SPIE
ISBN (Electronic)	9781510646186
DOIs	https://doi.org/10.1117/12.2592229
Publication status	Published - 2021
Event	International Conference on X-Ray Lasers 2020 - Virtual, Online Duration: 2020 Dec 8 → 2020 Dec 10

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	11886
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	International Conference on X-Ray Lasers 2020
City	Virtual, Online
Period	2020/12/08 → 2020/12/10

Subject classification (UKÄ)

Atom and Molecular Physics and Optics

Free keywords

Multilayer Laue lenses
Optics
X-rays
XFEL

Access to Document

10.1117/12.2592229

Cite this

Prasciolu, M., Murray, K. T., Ivanov, N., Fleckenstein, H., Domaracký, M., Gelisio, L., Trost, F., Ayyer, K., Krebs, D., Aplin, S., Awel, S., Boesenberg, U., Belšak, G., Barty, A., Estillore, A. D., Fuchs, M., Gevorkov, Y., Hallmann, J., Kim, C., ... Bajt, S. (2021). On the use of multilayer Laue lenses with X-ray free electron lasers. In D. Bleiner (Ed.), International Conference on X-Ray Lasers 2020 Article 118860M (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11886). SPIE. https://doi.org/10.1117/12.2592229

@inproceedings{54ff510d458a4ac385141e857ad5b3e1,

title = "On the use of multilayer Laue lenses with X-ray free electron lasers",

abstract = "We report on the use of multilayer Laue lenses to focus the intense X-ray Free Electron Laser (XFEL) beam at the European XFEL to a spot size of a few tens of nanometers. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique X-ray source. ",

keywords = "Multilayer Laue lenses, Optics, X-rays, XFEL",

author = "Mauro Prasciolu and Murray, \{Kevin T.\} and Nikolay Ivanov and Holger Fleckenstein and Martin Domarack{\'y} and Luca Gelisio and Fabian Trost and Kartik Ayyer and Dietrich Krebs and Steve Aplin and Salah Awel and Ulrike Boesenberg and Grega Bel{\v s}ak and Anton Barty and Estillore, \{Armando D.\} and Matthias Fuchs and Yaroslav Gevorkov and Joerg Hallmann and Chan Kim and Juraj Kno{\v s}ka and Jochen K{\"u}pper and Chufeng Li and Wei Lu and Valerio Mariani and Morgan, \{Andrew J.\} and Johannes M{\"o}ller and Anders Madsen and Dominik Oberth{\"u}r and Murillo, \{Gisel E.Pe{\~n}a\} and Reis, \{David A.\} and Markus Scholz and Bozidar {\v S}arler and Pablo Villanueva-Perez and Oleksandr Yefanov and Zielinski, \{Kara A.\} and Alexey Zozulya and Chapman, \{Henry N.\} and Sa{\v s}a Bajt",

note = "Publisher Copyright: {\textcopyright} 2021 COPYRIGHT SPIE.; International Conference on X-Ray Lasers 2020 ; Conference date: 08-12-2020 Through 10-12-2020",

year = "2021",

doi = "10.1117/12.2592229",

language = "English",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Davide Bleiner",

booktitle = "International Conference on X-Ray Lasers 2020",

address = "United States",

}

Prasciolu, M, Murray, KT, Ivanov, N, Fleckenstein, H, Domaracký, M, Gelisio, L, Trost, F, Ayyer, K, Krebs, D, Aplin, S, Awel, S, Boesenberg, U, Belšak, G, Barty, A, Estillore, AD, Fuchs, M, Gevorkov, Y, Hallmann, J, Kim, C, Knoška, J, Küpper, J, Li, C, Lu, W, Mariani, V, Morgan, AJ, Möller, J, Madsen, A, Oberthür, D, Murillo, GEP, Reis, DA, Scholz, M, Šarler, B, Villanueva-Perez, P, Yefanov, O, Zielinski, KA, Zozulya, A, Chapman, HN & Bajt, S 2021, On the use of multilayer Laue lenses with X-ray free electron lasers. in D Bleiner (ed.), International Conference on X-Ray Lasers 2020., 118860M, Proceedings of SPIE - The International Society for Optical Engineering, vol. 11886, SPIE, International Conference on X-Ray Lasers 2020, Virtual, Online, 2020/12/08. https://doi.org/10.1117/12.2592229

On the use of multilayer Laue lenses with X-ray free electron lasers. / Prasciolu, Mauro; Murray, Kevin T.; Ivanov, Nikolay et al.
International Conference on X-Ray Lasers 2020. ed. / Davide Bleiner. SPIE, 2021. 118860M (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11886).

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

TY - GEN

T1 - On the use of multilayer Laue lenses with X-ray free electron lasers

AU - Prasciolu, Mauro

AU - Murray, Kevin T.

AU - Ivanov, Nikolay

AU - Fleckenstein, Holger

AU - Domaracký, Martin

AU - Gelisio, Luca

AU - Trost, Fabian

AU - Ayyer, Kartik

AU - Krebs, Dietrich

AU - Aplin, Steve

AU - Awel, Salah

AU - Boesenberg, Ulrike

AU - Belšak, Grega

AU - Barty, Anton

AU - Estillore, Armando D.

AU - Fuchs, Matthias

AU - Gevorkov, Yaroslav

AU - Hallmann, Joerg

AU - Kim, Chan

AU - Knoška, Juraj

AU - Küpper, Jochen

AU - Li, Chufeng

AU - Lu, Wei

AU - Mariani, Valerio

AU - Morgan, Andrew J.

AU - Möller, Johannes

AU - Madsen, Anders

AU - Oberthür, Dominik

AU - Murillo, Gisel E.Peña

AU - Reis, David A.

AU - Scholz, Markus

AU - Šarler, Bozidar

AU - Villanueva-Perez, Pablo

AU - Yefanov, Oleksandr

AU - Zielinski, Kara A.

AU - Zozulya, Alexey

AU - Chapman, Henry N.

AU - Bajt, Saša

PY - 2021

Y1 - 2021

N2 - We report on the use of multilayer Laue lenses to focus the intense X-ray Free Electron Laser (XFEL) beam at the European XFEL to a spot size of a few tens of nanometers. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique X-ray source.

AB - We report on the use of multilayer Laue lenses to focus the intense X-ray Free Electron Laser (XFEL) beam at the European XFEL to a spot size of a few tens of nanometers. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique X-ray source.

KW - Multilayer Laue lenses

KW - Optics

KW - X-rays

KW - XFEL

UR - https://www.scopus.com/pages/publications/85121599205

U2 - 10.1117/12.2592229

DO - 10.1117/12.2592229

M3 - Paper in conference proceeding

AN - SCOPUS:85121599205

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - International Conference on X-Ray Lasers 2020

A2 - Bleiner, Davide

PB - SPIE

T2 - International Conference on X-Ray Lasers 2020

Y2 - 8 December 2020 through 10 December 2020

ER -

On the use of multilayer Laue lenses with X-ray free electron lasers

Abstract

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Subject classification (UKÄ)

Free keywords

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