Optically trapped non-linear particles as probes for scanning near-field optical microscopy

H.M Hertz; Lennart Malmqvist; L Rosengren; K Ljungberg

doi:10.1016/0304-3991(94)00158-J

Optically trapped non-linear particles as probes for scanning near-field optical microscopy

H.M Hertz, Lennart Malmqvist, L Rosengren, K Ljungberg

Atomic Physics

Research output: Contribution to journal › Article › peer-review

Abstract

We use the frequency doubled light from an optically trapped lithium niobate particle for non-intrusive scanning near-field optical microscopy. The detected power from this 50-100 nm diameter probe is currently tens of pW and is expected to approach nW with an improved detection system. The current experimental resolution is approximately 0.5 [mu]m, while the ultimate theoretical resolution is 70-90 nm. An acoustic trap which potentially allows higher resolution imaging is briefly described.

Original language	English
Pages (from-to)	309-312
Journal	Ultramicroscopy
Volume	57
Issue number	2-3
DOIs	https://doi.org/10.1016/0304-3991(94)00158-J
Publication status	Published - 1995

Subject classification (UKÄ)

Atom and Molecular Physics and Optics

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10.1016/0304-3991(94)00158-J

Cite this

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title = "Optically trapped non-linear particles as probes for scanning near-field optical microscopy",

abstract = "We use the frequency doubled light from an optically trapped lithium niobate particle for non-intrusive scanning near-field optical microscopy. The detected power from this 50-100 nm diameter probe is currently tens of pW and is expected to approach nW with an improved detection system. The current experimental resolution is approximately 0.5 [mu]m, while the ultimate theoretical resolution is 70-90 nm. An acoustic trap which potentially allows higher resolution imaging is briefly described.",

author = "H.M Hertz and Lennart Malmqvist and L Rosengren and K Ljungberg",

year = "1995",

doi = "10.1016/0304-3991(94)00158-J",

language = "English",

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journal = "Ultramicroscopy",

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T1 - Optically trapped non-linear particles as probes for scanning near-field optical microscopy

AU - Hertz, H.M

AU - Malmqvist, Lennart

AU - Rosengren, L

AU - Ljungberg, K

PY - 1995

Y1 - 1995

N2 - We use the frequency doubled light from an optically trapped lithium niobate particle for non-intrusive scanning near-field optical microscopy. The detected power from this 50-100 nm diameter probe is currently tens of pW and is expected to approach nW with an improved detection system. The current experimental resolution is approximately 0.5 [mu]m, while the ultimate theoretical resolution is 70-90 nm. An acoustic trap which potentially allows higher resolution imaging is briefly described.

AB - We use the frequency doubled light from an optically trapped lithium niobate particle for non-intrusive scanning near-field optical microscopy. The detected power from this 50-100 nm diameter probe is currently tens of pW and is expected to approach nW with an improved detection system. The current experimental resolution is approximately 0.5 [mu]m, while the ultimate theoretical resolution is 70-90 nm. An acoustic trap which potentially allows higher resolution imaging is briefly described.

UR - https://www.scopus.com/pages/publications/0029239657

U2 - 10.1016/0304-3991(94)00158-J

DO - 10.1016/0304-3991(94)00158-J

M3 - Article

SN - 0304-3991

VL - 57

SP - 309

EP - 312

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 2-3

ER -

Optically trapped non-linear particles as probes for scanning near-field optical microscopy

Abstract

Subject classification (UKÄ)

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