Photoreflectance study of the fundamental optical properties of (Ga,Mn) As epitaxial films

O. Yastrubchak, J. Zuk, H. Krzyzanowska, J. Z. Domagala, T. Andrearczyk, Janusz Sadowski, T. Wosinski

Research output: Contribution to journalArticlepeer-review

Abstract

Fundamental optical properties of thin films of the (Ga,Mn) As diluted ferromagnetic semiconductor with low (1%-2%) and high (4%-6%) Mn content and of a reference GaAs film, grown by low-temperature molecular-beam epitaxy, have been investigated by photoreflectance (PR) spectroscopy. In addition, the films were subjected to complementary characterization by means of superconducting quantum interference device magnetometry, Raman spectroscopy, and high-resolution x-ray diffractometry. Thorough full-line-shape analysis of the PR spectra, which enabled determination of the E-0 electronic transition in (Ga,Mn) As, revealed significant differences between the energy band structures in the vicinity of the Gamma point of the Brillouin zone in the investigated (Ga,Mn) As films. In view of the experimental results obtained, the evolution of the valence band structure in (Ga,Mn) As with increasing Mn content is discussed, pointing to a merging of the Mn-related impurity band with the host GaAs valence band for high Mn content.
Original languageEnglish
JournalPhysical Review B (Condensed Matter and Materials Physics)
Volume83
Issue number24
DOIs
Publication statusPublished - 2011

Subject classification (UKÄ)

  • Natural Sciences
  • Physical Sciences

Fingerprint

Dive into the research topics of 'Photoreflectance study of the fundamental optical properties of (Ga,Mn) As epitaxial films'. Together they form a unique fingerprint.

Cite this