Picosecond time-resolved x-ray refectivity of a laser-heated amorphous carbon film

Ralf Nüske, Andrius Jurgilaitis, H. Enquist, S. Dastjani Farahani, J. Gaudin, L. Guerin, Maher Harb, C. von Korff, M. Stoermer, M. Wulff, Jörgen Larsson

Research output: Contribution to journalArticlepeer-review

11 Citations (SciVal)


We demonstrate thin film x-ray reflectivity measurements with picosecond time resolution. Amorphous carbon films with a thickness of 46 nm were excited with laser pulses characterized by 100 fs duration, a wavelength of 800 nm, and a fluence of 70 mJ/cm(2). The laser-induced stress caused a rapid expansion of the thin film followed by a relaxation of the film thickness as heat diffused into the silicon substrate. We were able to measure changes in film thickness as small as 0.2 nm. The relaxation dynamics are consistent with a model which accounts for carrier-enhanced substrate heat diffusivity. (C) 2011 American Institute of Physics. [doi:10.1063/1.3562967]
Original languageEnglish
JournalApplied Physics Letters
Issue number10
Publication statusPublished - 2011

Subject classification (UKÄ)

  • Atom and Molecular Physics and Optics


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