Polarization dependence of light intensity distribution from nanometer metallic slits

C. H. Wei, Wunshain Fann, P. K. Wei, Jonas O. Tegenfeldt, Robert H. Austin

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

In this work, the near-field and far-field electric magnetic (EM) wave distributions of metallic slits was observed using tapered fiber probe and modelled using finite difference time domain (FDTD) computer simulations. The EM wave field distribution from rectangular slits with widths 100 nm, 300 nm, and 500 nm was mapped with excitation wavelength λ = 532 nm. λ/2 can be considered a characteristic length for the problem. From the experiments and FDTD simulation, E wave is found to be governed by the surface plasmon wave (SPW) which results in ill near field pattern and cannot be confined in the slit. On the contrary, E wave has a well-shaped field distribution and can be confined in the slit.

Original languageEnglish
Title of host publicationCLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics
Subtitle of host publicationPhotonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings
PublisherIEEE - Institute of Electrical and Electronics Engineers Inc.
Number of pages1
Volume2
ISBN (Electronic)0780377664
DOIs
Publication statusPublished - 2003 Jan 1
Event5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003 - Taipei, Taiwan
Duration: 2003 Dec 152003 Dec 19

Conference

Conference5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003
Country/TerritoryTaiwan
CityTaipei
Period2003/12/152003/12/19

Fingerprint

Dive into the research topics of 'Polarization dependence of light intensity distribution from nanometer metallic slits'. Together they form a unique fingerprint.

Cite this