Proton-Induced X-ray Emission Spectroscopy in Elemental Trace Analysis

Research output: Contribution to journalArticlepeer-review

Abstract

Using protons in the MeV range as excitation source and a high resolution Si(Li) detector,X-ray emission spectroscopy is shown to be capable of analyzing many elements with Z > 15 simultaneously at the 10-12 g level. This work discusses a theoretical lower limit of detection at moderate proton energies and gives examples of possible applications: analysis of the elemental composition of air-borne particles as a function of particle size, oil slick identification, and analysis of water and blood serum.
Original languageEnglish
Pages (from-to)373-387
JournalAdvances in X-Ray Analysis
Volume15
DOIs
Publication statusPublished - 1972

Bibliographical note

The information about affiliations in this record was updated in December 2015.
The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007), Ergonomics and Aerosol Technology (011025002), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)

Subject classification (UKÄ)

  • Production Engineering, Human Work Science and Ergonomics
  • Subatomic Physics

Free keywords

  • PIXE
  • particle induced x-ray emission analysis
  • trace element analysis

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