Ptychographic characterization of a coherent nanofocused X-ray beam

Alexander Björling, Sebastian Kalbfleisch, Maik Kahnt, Simone Sala, Karolis Parfeniukas, Ulrich Vogt, Gerardina Carbone, Ulf Johansson

Research output: Contribution to journalArticlepeer-review

Abstract

The NanoMAX hard X-ray nanoprobe is the first beamline to take full advantage of the diffraction-limited storage ring at the MAX IV synchrotron and delivers a high coherent photon flux for applications in diffraction and imaging. Here, we characterize its coherent and focused beam using ptychographic analysis. We derive beam profiles in the energy range 6-22 keV and estimate the coherent flux based on a probe mode decomposition approach.

Original languageEnglish
Pages (from-to)5069-5076
Number of pages8
JournalOptics Express
Volume28
Issue number4
DOIs
Publication statusPublished - 2020 Feb 17

Subject classification (UKÄ)

  • Atom and Molecular Physics and Optics

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