Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity

Christian G. Schroer; Martin Seyrich; Andreas Schropp; Ralph Döhrmann; Stephan Botta; Patrik Wiljes; Dennis Brückner; Maik Kahnt; Felix Wittwer; Lukas Grote; Dorota Koziej; Jan Garrevoet; Gerald Falkenberg

doi:10.1117/12.2529096

Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity

Christian G. Schroer, Martin Seyrich, Andreas Schropp, Ralph Döhrmann, Stephan Botta, Patrik Wiljes, Dennis Brückner, Maik Kahnt, Felix Wittwer, Lukas Grote, Dorota Koziej, Jan Garrevoet, Gerald Falkenberg

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

Abstract

The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.

Original language	English
Title of host publication	X-Ray Nanoimaging
Subtitle of host publication	Instruments and Methods IV
Editors	Barry Lai, Andrea Somogyi
Publisher	SPIE
ISBN (Electronic)	9781510629172
DOIs	https://doi.org/10.1117/12.2529096
Publication status	Published - 2019 Jan 1
Externally published	Yes
Event	X-Ray Nanoimaging: Instruments and Methods IV 2019 - San Diego, United States Duration: 2019 Aug 11 → 2019 Aug 12

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	11112
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	X-Ray Nanoimaging: Instruments and Methods IV 2019
Country/Territory	United States
City	San Diego
Period	2019/08/11 → 2019/08/12

Free keywords

Detection sensitivity
Ptychography
Signal-to-background ratio
Spatial resolution
Tomography
X-ray microscopy

Access to Document

10.1117/12.2529096

Lund Nano Lab - part of national infrastructure Myfab
Hankin, L. (Manager)
NanoLund: Centre for Nanoscience
Infrastructure

Cite this

Schroer, C. G., Seyrich, M., Schropp, A., Döhrmann, R., Botta, S., Wiljes, P., Brückner, D., Kahnt, M., Wittwer, F., Grote, L., Koziej, D., Garrevoet, J., & Falkenberg, G. (2019). Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity. In B. Lai, & A. Somogyi (Eds.), X-Ray Nanoimaging: Instruments and Methods IV Article 111120D (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11112). SPIE. https://doi.org/10.1117/12.2529096

Schroer, Christian G. ; Seyrich, Martin ; Schropp, Andreas et al. / Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III : Signal-to-background optimization for imaging with high sensitivity. X-Ray Nanoimaging: Instruments and Methods IV. editor / Barry Lai ; Andrea Somogyi. SPIE, 2019. (Proceedings of SPIE - The International Society for Optical Engineering).

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title = "Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity",

abstract = "The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.",

keywords = "Detection sensitivity, Ptychography, Signal-to-background ratio, Spatial resolution, Tomography, X-ray microscopy",

author = "Schroer, {Christian G.} and Martin Seyrich and Andreas Schropp and Ralph D{\"o}hrmann and Stephan Botta and Patrik Wiljes and Dennis Br{\"u}ckner and Maik Kahnt and Felix Wittwer and Lukas Grote and Dorota Koziej and Jan Garrevoet and Gerald Falkenberg",

year = "2019",

month = jan,

day = "1",

doi = "10.1117/12.2529096",

language = "English",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Barry Lai and Andrea Somogyi",

booktitle = "X-Ray Nanoimaging",

address = "United States",

note = "X-Ray Nanoimaging: Instruments and Methods IV 2019 ; Conference date: 11-08-2019 Through 12-08-2019",

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Schroer, CG, Seyrich, M, Schropp, A, Döhrmann, R, Botta, S, Wiljes, P, Brückner, D, Kahnt, M, Wittwer, F, Grote, L, Koziej, D, Garrevoet, J & Falkenberg, G 2019, Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity. in B Lai & A Somogyi (eds), X-Ray Nanoimaging: Instruments and Methods IV., 111120D, Proceedings of SPIE - The International Society for Optical Engineering, vol. 11112, SPIE, X-Ray Nanoimaging: Instruments and Methods IV 2019, San Diego, United States, 2019/08/11. https://doi.org/10.1117/12.2529096

Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity. / Schroer, Christian G.; Seyrich, Martin; Schropp, Andreas et al.
X-Ray Nanoimaging: Instruments and Methods IV. ed. / Barry Lai; Andrea Somogyi. SPIE, 2019. 111120D (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11112).

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

TY - GEN

T1 - Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III

T2 - X-Ray Nanoimaging: Instruments and Methods IV 2019

AU - Schroer, Christian G.

AU - Seyrich, Martin

AU - Schropp, Andreas

AU - Döhrmann, Ralph

AU - Botta, Stephan

AU - Wiljes, Patrik

AU - Brückner, Dennis

AU - Kahnt, Maik

AU - Wittwer, Felix

AU - Grote, Lukas

AU - Koziej, Dorota

AU - Garrevoet, Jan

AU - Falkenberg, Gerald

PY - 2019/1/1

Y1 - 2019/1/1

N2 - The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.

AB - The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.

KW - Detection sensitivity

KW - Ptychography

KW - Signal-to-background ratio

KW - Spatial resolution

KW - Tomography

KW - X-ray microscopy

U2 - 10.1117/12.2529096

DO - 10.1117/12.2529096

M3 - Paper in conference proceeding

AN - SCOPUS:85076544214

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - X-Ray Nanoimaging

A2 - Lai, Barry

A2 - Somogyi, Andrea

PB - SPIE

Y2 - 11 August 2019 through 12 August 2019

ER -

Schroer CG, Seyrich M, Schropp A, Döhrmann R, Botta S, Wiljes P et al. Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity. In Lai B, Somogyi A, editors, X-Ray Nanoimaging: Instruments and Methods IV. SPIE. 2019. 111120D. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2529096

Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity

Abstract

Publication series

Conference

Free keywords

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Equipment

Lund Nano Lab - part of national infrastructure Myfab

Cite this