Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity

Christian G. Schroer, Martin Seyrich, Andreas Schropp, Ralph Döhrmann, Stephan Botta, Patrik Wiljes, Dennis Brückner, Maik Kahnt, Felix Wittwer, Lukas Grote, Dorota Koziej, Jan Garrevoet, Gerald Falkenberg

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

9 Citations (SciVal)

Abstract

The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.

Original languageEnglish
Title of host publicationX-Ray Nanoimaging
Subtitle of host publicationInstruments and Methods IV
EditorsBarry Lai, Andrea Somogyi
PublisherSPIE
ISBN (Electronic)9781510629172
DOIs
Publication statusPublished - 2019 Jan 1
Externally publishedYes
EventX-Ray Nanoimaging: Instruments and Methods IV 2019 - San Diego, United States
Duration: 2019 Aug 112019 Aug 12

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11112
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceX-Ray Nanoimaging: Instruments and Methods IV 2019
Country/TerritoryUnited States
CitySan Diego
Period2019/08/112019/08/12

Keywords

  • Detection sensitivity
  • Ptychography
  • Signal-to-background ratio
  • Spatial resolution
  • Tomography
  • X-ray microscopy

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