@inproceedings{6c55563794754ce08c6cbfe89fa16485,
title = "Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses",
abstract = "It is shown that the high-resolution laser photoelectron microscope withsubwavelength-spatial resolution can be used for an absolute values ofthe two-photon external photoelectric effect measurements with high (afew nm-scale) localization. The spatial distribution of light intensityin the near field is studied by observing the photoelectron projectionimages of a subwavelength nanoaperture. The imaging electrons areobtained as a result of two-photon external photoelectric effect inducedin the aperture formed at the end of an optical fiber by femtosecondpulses of the second-harmonic radiation (410 nm) of a Ti:sapphire laser.The light-field distribution in the aperture is not distorted by anynear-by object, which allows the first nonperturbing measurement of sucha distribution.",
author = "Chekalin, {Sergey V.} and Kompanets, {V. O.} and Vladilen Letokhov and Matveets, {Yu A.} and Mironov, {B. N.} and Sekatskii, {S. K.}",
year = "2004",
doi = "10.1117/12.558810",
language = "English",
volume = "5402",
publisher = "SPIE",
pages = "17--24",
booktitle = "International Workshop on Quantum Optics 2003. Edited by Samartsev, Vitaly V. Proceedings of the SPIE, Volume 5402, pp. 17-24 (2004).",
address = "United States",
}