Resonant inelastic soft x-ray scattering on LaPt2Si2

Deepak John Mukkattukavil, Johan Hellsvik, Anirudha Ghosh, Evanthia Chatzigeorgiou, Elisabetta Nocerino, Qisi Wang, Karin Von Arx, Shih Wen Huang, Victor Ekholm, Zakir Hossain, Arumugum Thamizhavel, Johan Chang, Martin Månsson, Lars Nordström, Conny Såthe, Marcus Agåker, Jan Erik Rubensson, Yasmine Sassa

Research output: Contribution to journalArticlepeer-review

Abstract

X-ray absorption and resonant inelastic x-ray scattering spectra of LaPt2Si2 single crystal at the Si 2p and La 4d edges are presented. The data are interpreted in terms of density functional theory, showing that the Si spectra can be described in terms of Si s and d local partial density of states (LPDOS), and the La spectra are due to quasi-atomic local 4f excitations. Calculations show that Pt d-LPDOS dominates the occupied states, and a sharp localized La f state is found in the unoccupied states, in line with the observations.

Original languageEnglish
Article number324003
JournalJournal of Physics Condensed Matter
Volume34
Issue number32
DOIs
Publication statusPublished - 2022 Aug 10

Subject classification (UKÄ)

  • Theoretical Chemistry
  • Atom and Molecular Physics and Optics

Free keywords

  • charge density wave
  • local partial density of states
  • resonant inelastic x-ray scattering
  • superconductivity

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