Abstract
Here we present the results of a study of the electronic structure using the resonant inelastic scattering process at the F 1s photoabsorption edge in LiF and O 1s edge of MgO crystals. In case of excitations in the sub-threshold region, the Raman-type linear dispersion of X-ray fluorescence peak was observed for the studied compounds. In LiF, the narrowing of the X-ray fluorescence peak is observed at pre-threshold excitation, which can be related to the creation of a core exciton, but no core excitons were identified in MgO.
| Original language | English |
|---|---|
| Pages (from-to) | 845-848 |
| Journal | Journal of Electron Spectroscopy and Related Phenomena |
| Volume | 144-147 |
| DOIs | |
| Publication status | Published - 2005 |
Subject classification (UKÄ)
- Physical Sciences
- Natural Sciences
Free keywords
- resonant inelastic X-ray scattering
- X-ray emission
- core exciton
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