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Resonant inelastic X-ray scattering at the K edge of oxygen and fluorine in insulators

A Kikas, Tanel Käämbre, V Kisand, A Saar, K Kooser, E Nommiste, Indrek Martinson

Research output: Contribution to journalArticlepeer-review

Abstract

Here we present the results of a study of the electronic structure using the resonant inelastic scattering process at the F 1s photoabsorption edge in LiF and O 1s edge of MgO crystals. In case of excitations in the sub-threshold region, the Raman-type linear dispersion of X-ray fluorescence peak was observed for the studied compounds. In LiF, the narrowing of the X-ray fluorescence peak is observed at pre-threshold excitation, which can be related to the creation of a core exciton, but no core excitons were identified in MgO.
Original languageEnglish
Pages (from-to)845-848
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume144-147
DOIs
Publication statusPublished - 2005

Subject classification (UKÄ)

  • Physical Sciences
  • Natural Sciences

Free keywords

  • resonant inelastic X-ray scattering
  • X-ray emission
  • core exciton

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