Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

Didem Ketenoglu; Manuel Harder; Konstantin Klementiev; Mary Upton; Mehran Taherkhani; Manfred Spiwek; Frank-Uwe Dill; Hans-Christian Wille; Hasan Yavas

doi:10.1107/S1600577515009686

Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

Didem Ketenoglu, Manuel Harder, Konstantin Klementiev, Mary Upton, Mehran Taherkhani, Manfred Spiwek, Frank-Uwe Dill, Hans-Christian Wille, Hasan Yavas

MAX IV Laboratory

Research output: Contribution to journal › Article › peer-review

Abstract

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.

Original language	English
Pages (from-to)	961-967
Journal	Journal of Synchrotron Radiation
Volume	22
DOIs	https://doi.org/10.1107/S1600577515009686
Publication status	Published - 2015

Subject classification (UKÄ)

Atom and Molecular Physics and Optics

Free keywords

resonant inelastic X-ray scattering (RIXS)
high energy-resolution
diced crystal analyzers
quartz

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10.1107/S1600577515009686

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title = "Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge",

abstract = "An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.",

keywords = "resonant inelastic X-ray scattering (RIXS), high energy-resolution, diced crystal analyzers, quartz",

author = "Didem Ketenoglu and Manuel Harder and Konstantin Klementiev and Mary Upton and Mehran Taherkhani and Manfred Spiwek and Frank-Uwe Dill and Hans-Christian Wille and Hasan Yavas",

year = "2015",

doi = "10.1107/S1600577515009686",

language = "English",

volume = "22",

pages = "961--967",

journal = "Journal of Synchrotron Radiation",

issn = "1600-5775",

publisher = "International Union of Crystallography",

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TY - JOUR

T1 - Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

AU - Ketenoglu, Didem

AU - Harder, Manuel

AU - Klementiev, Konstantin

AU - Upton, Mary

AU - Taherkhani, Mehran

AU - Spiwek, Manfred

AU - Dill, Frank-Uwe

AU - Wille, Hans-Christian

AU - Yavas, Hasan

PY - 2015

Y1 - 2015

N2 - An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.

AB - An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.

KW - resonant inelastic X-ray scattering (RIXS)

KW - high energy-resolution

KW - diced crystal analyzers

KW - quartz

U2 - 10.1107/S1600577515009686

DO - 10.1107/S1600577515009686

M3 - Article

C2 - 26134800

SN - 1600-5775

VL - 22

SP - 961

EP - 967

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

ER -

Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

Abstract

Subject classification (UKÄ)

Free keywords

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