Fingerprint
Dive into the research topics of 'RF reliability of gate last InGaAs nMOSFETs with high-k dielectric'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
RF reliability of gate last InGaAs nMOSFETs with high-k dielectric
Guntrade Roll, Mikael Egard, Sofia Johannson, Lars Ohlsson, Lars Erik Wernersson, Erik Lind
Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review