Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC

Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara

Research output: Contribution to conference › Paper, not in proceeding › peer-review

Original language	English
Pages	43-48
Publication status	Published - 2009
Externally published	Yes
Event	10th IEEE Workshop on RTL and High Level Testing (WRTLT'09) - Hongkong, China Duration: 2009 Nov 27 → 2009 Nov 28

Conference	10th IEEE Workshop on RTL and High Level Testing (WRTLT'09)
Country/Territory	China
City	Hongkong
Period	2009/11/27 → 2009/11/28

Subject classification (UKÄ)

@conference{2914a7f0e4e3489a96a05fb1889474bc,

title = "Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC",

author = "Tudu, {Jaynarayan T.} and Erik Larsson and Virendra Singh and Hideo Fujiwara",

year = "2009",

language = "English",

pages = "43--48",

note = "10th IEEE Workshop on RTL and High Level Testing (WRTLT'09) ; Conference date: 27-11-2009 Through 28-11-2009",

}