Sensitivity analysis of the Benchmark Simulation Model no 1

M.-N. Pons; Ulf Jeppsson; Xavier Flores; L. Benedetti; M. Lourenco da Silva; I. Nopens; J. Alex; J.B. Copp; K.V. Gernaey; Christian Rosén; J.-P. Steyer; P.A. Vanrolleghem

Sensitivity analysis of the Benchmark Simulation Model no 1

M.-N. Pons, Ulf Jeppsson, Xavier Flores, L. Benedetti, M. Lourenco da Silva, I. Nopens, J. Alex, J.B. Copp, K.V. Gernaey, Christian Rosén, J.-P. Steyer, P.A. Vanrolleghem

Industrial Electrical Engineering and Automation

Research output: Contribution to conference › Paper, not in proceeding › peer-review

Original language	English
Publication status	Published - 2008
Event	18th European symposium on Computer Aided Process Engineering (ESCAPE-18) - Lyon, France Duration: 2008 Jun 1 → …

Conference

Conference	18th European symposium on Computer Aided Process Engineering (ESCAPE-18)
Country/Territory	France
City	Lyon
Period	2008/06/01 → …

Subject classification (UKÄ)

Other Electrical Engineering, Electronic Engineering, Information Engineering

Cite this

@conference{9a3c3c3d09b748aab2c087062b9441d3,

title = "Sensitivity analysis of the Benchmark Simulation Model no 1",

author = "M.-N. Pons and Ulf Jeppsson and Xavier Flores and L. Benedetti and {Lourenco da Silva}, M. and I. Nopens and J. Alex and J.B. Copp and K.V. Gernaey and Christian Ros{\'e}n and J.-P. Steyer and P.A. Vanrolleghem",

year = "2008",

language = "English",

note = "18th European symposium on Computer Aided Process Engineering (ESCAPE-18) ; Conference date: 01-06-2008",

}

TY - CONF

T1 - Sensitivity analysis of the Benchmark Simulation Model no 1

AU - Pons, M.-N.

AU - Jeppsson, Ulf

AU - Flores, Xavier

AU - Benedetti, L.

AU - Lourenco da Silva, M.

AU - Nopens, I.

AU - Alex, J.

AU - Copp, J.B.

AU - Gernaey, K.V.

AU - Rosén, Christian

AU - Steyer, J.-P.

AU - Vanrolleghem, P.A.

PY - 2008

Y1 - 2008

M3 - Paper, not in proceeding

T2 - 18th European symposium on Computer Aided Process Engineering (ESCAPE-18)

Y2 - 1 June 2008

ER -