Abstract
Thin chromium cantilevers with sub-100 nm thickness have been characterized by an atomic force microscope operating in contact mode. A continuous determination of the local mechanical properties at all lengths was accomplished by applying force along the length of the cantilevers. The result show a decrease of the Young's modulus as the cantilevers get thinner.
Original language | English |
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Pages (from-to) | 3555-3557 |
Journal | Applied Physics Letters |
Volume | 85 |
Issue number | 16 |
DOIs | |
Publication status | Published - 2004 |
Subject classification (UKÄ)
- Condensed Matter Physics