Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films

J. M. Tonnerre; N. Jaouen; E. Bontempi; D. Carbone; D. Babonneau; M. De Santis; N. Tolentino; S. Grenier; S. Garaudee; U. Staub

doi:10.1088/1742-6596/211/1/012015

Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films

J. M. Tonnerre, N. Jaouen, E. Bontempi, D. Carbone, D. Babonneau, M. De Santis, N. Tolentino, S. Grenier, S. Garaudee, U. Staub

Research output: Contribution to journal › Article › peer-review

Abstract

The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system.

Original language	English
Article number	012015
Journal	Journal of Physics: Conference Series
Volume	211
DOIs	https://doi.org/10.1088/1742-6596/211/1/012015
Publication status	Published - 2010
Externally published	Yes

Access to Document

10.1088/1742-6596/211/1/012015

Cite this

Tonnerre, J. M., Jaouen, N., Bontempi, E., Carbone, D., Babonneau, D., De Santis, M., Tolentino, N., Grenier, S., Garaudee, S., & Staub, U. (2010). Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films. Journal of Physics: Conference Series, 211, Article 012015. https://doi.org/10.1088/1742-6596/211/1/012015

@article{67179236b0b0421ca8a8a985c1537462,

title = "Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films",

abstract = "The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system.",

author = "Tonnerre, {J. M.} and N. Jaouen and E. Bontempi and D. Carbone and D. Babonneau and {De Santis}, M. and N. Tolentino and S. Grenier and S. Garaudee and U. Staub",

year = "2010",

doi = "10.1088/1742-6596/211/1/012015",

language = "English",

volume = "211",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing",

}

TY - JOUR

T1 - Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films

AU - Tonnerre, J. M.

AU - Jaouen, N.

AU - Bontempi, E.

AU - Carbone, D.

AU - Babonneau, D.

AU - De Santis, M.

AU - Tolentino, N.

AU - Grenier, S.

AU - Garaudee, S.

AU - Staub, U.

PY - 2010

Y1 - 2010

N2 - The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system.

AB - The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system.

U2 - 10.1088/1742-6596/211/1/012015

DO - 10.1088/1742-6596/211/1/012015

M3 - Article

AN - SCOPUS:77950472785

SN - 1742-6588

VL - 211

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

M1 - 012015

ER -

Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films

Abstract

Access to Document

Fingerprint

Cite this