Special Issue On "Advanced Control Methods For Scanning Probe Microscopy"

Georg Schitter, Karl Johan Åström

Research output: Contribution to journalDebate/Note/Editorial

Original languageEnglish
Pages (from-to)101-103
JournalAsian Journal of Control
Volume11
Issue number2
DOIs
Publication statusPublished - 2009

Subject classification (UKÄ)

  • Control Engineering

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