Abstract
In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy
| Original language | English |
|---|---|
| Title of host publication | [Host publication title missing] |
| Publisher | IEEE - Institute of Electrical and Electronics Engineers Inc. |
| Pages | 81-85 |
| ISBN (Print) | 0-7803-8521-7 |
| DOIs | |
| Publication status | Published - 2004 |
| Event | IEEE Vehicular Technology Conference (VTC2004-fall) - Los Angeles, CA, United States Duration: 2004 Sept 26 → 2004 Sept 29 |
Conference
| Conference | IEEE Vehicular Technology Conference (VTC2004-fall) |
|---|---|
| Country/Territory | United States |
| City | Los Angeles, CA |
| Period | 2004/09/26 → 2004/09/29 |
Subject classification (UKÄ)
- Electrical Engineering, Electronic Engineering, Information Engineering
Free keywords
- metallic scatterers
- industrial environment
- dense multipath scattering
- nonline-of-sight scenarios
- 3.1 to 10.6 GHz
- ray power decay constants
- UWB channel
- power delay profile
- statistical analysis
- Saleh-Valenzuela model
- Rayleigh distributed small-scale fading signal
- Nakagami distributions
- factory hall