The GeoPIXE software for quantitative PIXE trace element imaging and analysis is a well established package for evaluation of characteristic X-ray data for both PIXE and SXRF. For the case of microbeam applications on semi-thick samples knowledge of the local areal density distribution is important for precise quantification. A technique is reported to achieve this using the measurement of beam particle energy loss as it traverses the sample, as in scanning transmission ion microscopy (STIM). New functionality is added to the GeoPIXE code through integration of routines for STIM sorting of event-by-event data to create elemental maps of the mean energy after traversing the sample. Integration of stopping powers for a given sample matrix then permits the measured energy loss to be related to the local areal density. In a further step, this information is used for X-ray absorption corrections made directly to the PIXE analysis results. As a complement, user-written plugins operating on single STIM spectra have been used to compare the estimated areal density from chosen spots with the corresponding values calculated with the new GeoPIXE routines. The additions made to the code allow a more precise quantification to be done on inhomogeneous, semi-thick samples. (C) 2009 Elsevier B.V. All rights reserved.
|Title of host publication||Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms|
|Publication status||Published - 2009|
|Event||11th International Conference on Nuclear Microprobe Technology and Applications/3rd International Workshop on Proton Beam Writing - Debrecen, Hungary|
Duration: 2008 Jul 20 → 2008 Jul 25
|Conference||11th International Conference on Nuclear Microprobe Technology and Applications/3rd International Workshop on Proton Beam Writing|
|Period||2008/07/20 → 2008/07/25|
Bibliographical noteThe information about affiliations in this record was updated in December 2015.
The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007)
Subject classification (UKÄ)
- Subatomic Physics
- Semi-thick samples