Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS1-xSex)1.16(Nb 1.036S2)2

Mohammed Kars; Daniel C. Fredrickson; A. Gómez-Herrero; Sven Lidin; Allaoua Rebbah; L. C. Otero-Diáz

doi:10.1016/j.materresbull.2010.04.011

Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS_1-xSe_x)_1.16(Nb _1.036S₂)₂

Mohammed Kars, Daniel C. Fredrickson, A. Gómez-Herrero, Sven Lidin, Allaoua Rebbah, L. C. Otero-Diáz

Research output: Contribution to journal › Article › peer-review

Abstract

In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS_1-xSe _x) slabs stacking alternately with double NbS₂ layers and both can be treated as separate monoclinic subsystems. The (SbS _1-xSe_x) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX₅} square pyramids joined by edges (X: S, Se); the NbS₂ layers consist of {NbS ₆} trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS₂ structure type. Both sublattices have the same lattice parameters a = 5.7672(19) Å, c = 17.618(6) Å and β = 96.18(3)°, with incommensurability occurring along the b direction: b ₁ =3.3442(13)Å for the NbS₂ subsystem and b ₂ = 2.8755(13)Å for the (SbS_1-xSe_x) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS_1-xSe_x) subsystem is subjected to extended defects along the stacking direction.

Original language	English
Pages (from-to)	982-988
Number of pages	7
Journal	Materials Research Bulletin
Volume	45
Issue number	8
DOIs	https://doi.org/10.1016/j.materresbull.2010.04.011
Publication status	Published - 2010 Aug 1
Externally published	Yes

Free keywords

Crystal growth
Crystal structure
Electron microscopy
Layered compound
X-ray diffraction

Access to Document

10.1016/j.materresbull.2010.04.011

Cite this

@article{7f3af003aa37498280c32b97eadce0a0,

title = "Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS1-xSex)1.16(Nb 1.036S2)2",

abstract = "In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS1-xSe x) slabs stacking alternately with double NbS2 layers and both can be treated as separate monoclinic subsystems. The (SbS 1-xSex) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX5} square pyramids joined by edges (X: S, Se); the NbS2 layers consist of {NbS 6} trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS2 structure type. Both sublattices have the same lattice parameters a = 5.7672(19) {\AA}, c = 17.618(6) {\AA} and β = 96.18(3)°, with incommensurability occurring along the b direction: b 1 =3.3442(13){\AA} for the NbS2 subsystem and b 2 = 2.8755(13){\AA} for the (SbS1-xSex) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS1-xSex) subsystem is subjected to extended defects along the stacking direction.",

keywords = "Crystal growth, Crystal structure, Electron microscopy, Layered compound, X-ray diffraction",

author = "Mohammed Kars and Fredrickson, {Daniel C.} and A. G{\'o}mez-Herrero and Sven Lidin and Allaoua Rebbah and Otero-Di{\'a}z, {L. C.}",

year = "2010",

month = aug,

day = "1",

doi = "10.1016/j.materresbull.2010.04.011",

language = "English",

volume = "45",

pages = "982--988",

journal = "Materials Research Bulletin",

issn = "0025-5408",

publisher = "Elsevier",

number = "8",

}

TY - JOUR

T1 - Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS1-xSex)1.16(Nb 1.036S2)2

AU - Kars, Mohammed

AU - Fredrickson, Daniel C.

AU - Gómez-Herrero, A.

AU - Lidin, Sven

AU - Rebbah, Allaoua

AU - Otero-Diáz, L. C.

PY - 2010/8/1

Y1 - 2010/8/1

N2 - In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS1-xSe x) slabs stacking alternately with double NbS2 layers and both can be treated as separate monoclinic subsystems. The (SbS 1-xSex) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX5} square pyramids joined by edges (X: S, Se); the NbS2 layers consist of {NbS 6} trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS2 structure type. Both sublattices have the same lattice parameters a = 5.7672(19) Å, c = 17.618(6) Å and β = 96.18(3)°, with incommensurability occurring along the b direction: b 1 =3.3442(13)Å for the NbS2 subsystem and b 2 = 2.8755(13)Å for the (SbS1-xSex) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS1-xSex) subsystem is subjected to extended defects along the stacking direction.

AB - In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS1-xSe x) slabs stacking alternately with double NbS2 layers and both can be treated as separate monoclinic subsystems. The (SbS 1-xSex) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX5} square pyramids joined by edges (X: S, Se); the NbS2 layers consist of {NbS 6} trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS2 structure type. Both sublattices have the same lattice parameters a = 5.7672(19) Å, c = 17.618(6) Å and β = 96.18(3)°, with incommensurability occurring along the b direction: b 1 =3.3442(13)Å for the NbS2 subsystem and b 2 = 2.8755(13)Å for the (SbS1-xSex) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS1-xSex) subsystem is subjected to extended defects along the stacking direction.

KW - Crystal growth

KW - Crystal structure

KW - Electron microscopy

KW - Layered compound

KW - X-ray diffraction

U2 - 10.1016/j.materresbull.2010.04.011

DO - 10.1016/j.materresbull.2010.04.011

M3 - Article

AN - SCOPUS:77954217315

SN - 0025-5408

VL - 45

SP - 982

EP - 988

JO - Materials Research Bulletin

JF - Materials Research Bulletin

IS - 8