Studying the effect of oxygen content on the electron structure of Nd1.85Ce0.15CuO4 by means of photoelectron spectromicroscopy

A. A. Ivanov; Alexei Zakharov; A. P. Menushenkov; M. B. Tsetlin; M. N. Mikheeva; Ingolf Lindau

doi:10.1134/S1063776107070539

Studying the effect of oxygen content on the electron structure of Nd1.85Ce0.15CuO4 by means of photoelectron spectromicroscopy

A. A. Ivanov, Alexei Zakharov, A. P. Menushenkov, M. B. Tsetlin, M. N. Mikheeva, Ingolf Lindau

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Abstract

Changes in the electron structure of the surface layer of Nd1.85Ce0.15CuO4 (NCCO) epitaxial films, which were caused by variation of the oxygen content and modification of the crystal structure of samples as a result of Ar+ ion etching and annealing, have been studied by means of photoelectron spectromicroscopy. A method is proposed for the cleaning the surface of oxygen-containing superconductors, which includes sequential stages of deep ion etching, high-temperature annealing in an oxygen-containing atmosphere (for the structural recovery and saturation with oxygen), a short-term ion etching (for the removal of an adsorbed layer of the oxidizer), and the final vacuum annealing of radiation-induced effects. The application of this procedure to NCCO films allowed an electron structure to be obtained, which was identical to that inherent in the surface of single crystals cleaved in situ in the measurement chamber.

Original language	English
Pages (from-to)	241-245
Journal	Journal of Experimental and Theoretical Physics
Volume	105
Issue number	1
DOIs	https://doi.org/10.1134/S1063776107070539
Publication status	Published - 2007

Subject classification (UKÄ)

Natural Sciences
Physical Sciences
Atom and Molecular Physics and Optics

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title = "Studying the effect of oxygen content on the electron structure of Nd1.85Ce0.15CuO4 by means of photoelectron spectromicroscopy",

abstract = "Changes in the electron structure of the surface layer of Nd1.85Ce0.15CuO4 (NCCO) epitaxial films, which were caused by variation of the oxygen content and modification of the crystal structure of samples as a result of Ar+ ion etching and annealing, have been studied by means of photoelectron spectromicroscopy. A method is proposed for the cleaning the surface of oxygen-containing superconductors, which includes sequential stages of deep ion etching, high-temperature annealing in an oxygen-containing atmosphere (for the structural recovery and saturation with oxygen), a short-term ion etching (for the removal of an adsorbed layer of the oxidizer), and the final vacuum annealing of radiation-induced effects. The application of this procedure to NCCO films allowed an electron structure to be obtained, which was identical to that inherent in the surface of single crystals cleaved in situ in the measurement chamber.",

author = "Ivanov, {A. A.} and Alexei Zakharov and Menushenkov, {A. P.} and Tsetlin, {M. B.} and Mikheeva, {M. N.} and Ingolf Lindau",

year = "2007",

doi = "10.1134/S1063776107070539",

language = "English",

volume = "105",

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journal = "Journal of Experimental and Theoretical Physics",

issn = "1063-7761",

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TY - JOUR

T1 - Studying the effect of oxygen content on the electron structure of Nd1.85Ce0.15CuO4 by means of photoelectron spectromicroscopy

AU - Ivanov, A. A.

AU - Zakharov, Alexei

AU - Menushenkov, A. P.

AU - Tsetlin, M. B.

AU - Mikheeva, M. N.

AU - Lindau, Ingolf

PY - 2007

Y1 - 2007

N2 - Changes in the electron structure of the surface layer of Nd1.85Ce0.15CuO4 (NCCO) epitaxial films, which were caused by variation of the oxygen content and modification of the crystal structure of samples as a result of Ar+ ion etching and annealing, have been studied by means of photoelectron spectromicroscopy. A method is proposed for the cleaning the surface of oxygen-containing superconductors, which includes sequential stages of deep ion etching, high-temperature annealing in an oxygen-containing atmosphere (for the structural recovery and saturation with oxygen), a short-term ion etching (for the removal of an adsorbed layer of the oxidizer), and the final vacuum annealing of radiation-induced effects. The application of this procedure to NCCO films allowed an electron structure to be obtained, which was identical to that inherent in the surface of single crystals cleaved in situ in the measurement chamber.

AB - Changes in the electron structure of the surface layer of Nd1.85Ce0.15CuO4 (NCCO) epitaxial films, which were caused by variation of the oxygen content and modification of the crystal structure of samples as a result of Ar+ ion etching and annealing, have been studied by means of photoelectron spectromicroscopy. A method is proposed for the cleaning the surface of oxygen-containing superconductors, which includes sequential stages of deep ion etching, high-temperature annealing in an oxygen-containing atmosphere (for the structural recovery and saturation with oxygen), a short-term ion etching (for the removal of an adsorbed layer of the oxidizer), and the final vacuum annealing of radiation-induced effects. The application of this procedure to NCCO films allowed an electron structure to be obtained, which was identical to that inherent in the surface of single crystals cleaved in situ in the measurement chamber.

U2 - 10.1134/S1063776107070539

DO - 10.1134/S1063776107070539

M3 - Article

SN - 1063-7761

VL - 105

SP - 241

EP - 245

JO - Journal of Experimental and Theoretical Physics

JF - Journal of Experimental and Theoretical Physics

IS - 1

ER -

Studying the effect of oxygen content on the electron structure of Nd1.85Ce0.15CuO4 by means of photoelectron spectromicroscopy

Abstract

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