TY - JOUR
T1 - Super-resolution X-ray imaging with hybrid pixel detectors using electromagnetic source stepping
AU - Dreier, Till
AU - Bech, Martin
AU - Lundström, Ulf
PY - 2020/3/2
Y1 - 2020/3/2
N2 - With increasing demand for high-resolution X-ray images, the super-resolution method allows to estimate a single high-resolution image from several low-resolution images. Hybrid pixel detectors provide high-quality and low-resolution images, which makes them particularlywell suited for super-resolution. However, such detectors consist of a limited number of pixels at high cost. Applying super-resolution with hybrid pixel detectors shows that it is a viable method to obtain high-resolution images. The point-spread function of such detectors can be idealised to be 1 pixel, adding no blur into the image making such detectors the ideal choice for the application of super- resolution X-ray imaging. However, there are charge sharing effects between the pixels caused by the energy and impact position of incoming photons. Utilising an X-ray source, which allows magnetic stepping of the X-ray spot, several slightly shifted images can be obtained without requiring mechanical movements. Registering the shifts between individual images with sub-pixel precision allows to estimate a high-resolution image. With repeatable and equally spaced X-ray spot position patterns, sufficient information can be obtained with only a few images. In this paper, we present the application of super-resolution for X-ray imaging using a Pilatus 100K hybrid pixel detector from Dectris Ltd. and a prototype micro-focus X-ray source from Excillum AB. Moreover, we analyse the image quality for applications in X-ray radiography and tomography. Using a sufficient number of low-resolution images allows us to achieve an increase in resolution, without introducing significant blur or artefacts into the image. Here we quantify the effects on the quality of resulting super-resolution images using different methods of image interpolation, interpolation factors, shifts of the sample on the detector, and amount of low-resolution images.
AB - With increasing demand for high-resolution X-ray images, the super-resolution method allows to estimate a single high-resolution image from several low-resolution images. Hybrid pixel detectors provide high-quality and low-resolution images, which makes them particularlywell suited for super-resolution. However, such detectors consist of a limited number of pixels at high cost. Applying super-resolution with hybrid pixel detectors shows that it is a viable method to obtain high-resolution images. The point-spread function of such detectors can be idealised to be 1 pixel, adding no blur into the image making such detectors the ideal choice for the application of super- resolution X-ray imaging. However, there are charge sharing effects between the pixels caused by the energy and impact position of incoming photons. Utilising an X-ray source, which allows magnetic stepping of the X-ray spot, several slightly shifted images can be obtained without requiring mechanical movements. Registering the shifts between individual images with sub-pixel precision allows to estimate a high-resolution image. With repeatable and equally spaced X-ray spot position patterns, sufficient information can be obtained with only a few images. In this paper, we present the application of super-resolution for X-ray imaging using a Pilatus 100K hybrid pixel detector from Dectris Ltd. and a prototype micro-focus X-ray source from Excillum AB. Moreover, we analyse the image quality for applications in X-ray radiography and tomography. Using a sufficient number of low-resolution images allows us to achieve an increase in resolution, without introducing significant blur or artefacts into the image. Here we quantify the effects on the quality of resulting super-resolution images using different methods of image interpolation, interpolation factors, shifts of the sample on the detector, and amount of low-resolution images.
UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85084174447&origin=inward&txGid
U2 - 10.1088/1748-0221/15/03/C03002
DO - 10.1088/1748-0221/15/03/C03002
M3 - Article
SN - 1748-0221
VL - 15
JO - Journal of Instrumentation
JF - Journal of Instrumentation
IS - 3
M1 - C03002
ER -