Abstract
One of the great challenges within software testing is to know ira test suite covers a program sufficiently. Mutation analysis is presented as an approach to address that challenge. Faulty versions, or mutants, are created and it is investigated if the test suite is able to discover the defects. The technique is mostly applied to the unit level testing of software programs. In this paper, mutation analysis is applied to integration and system level testing in addition to unit level testing. A state based specification and description language, SDL, is used. The specific structural information is used to employ mutation analysis at different abstraction levels.
| Original language | English |
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| Title of host publication | Proceedings. Eighth Annual IEEE International Conference and Workshop On the Engineering of Computer-Based Systems-ECBS 2001 |
| Publisher | IEEE - Institute of Electrical and Electronics Engineers Inc. |
| Pages | 222-228 |
| Number of pages | 7 |
| ISBN (Print) | 0-7695-1086-8 |
| DOIs | |
| Publication status | Published - 2001 |
| Event | 8th Annual IEEE International Conference on the Workshop on the Engineering of Computer Based Systems - Washington, DC, United States Duration: 2001 Apr 17 → 2001 Apr 20 |
Conference
| Conference | 8th Annual IEEE International Conference on the Workshop on the Engineering of Computer Based Systems |
|---|---|
| Country/Territory | United States |
| City | Washington, DC |
| Period | 2001/04/17 → 2001/04/20 |
Subject classification (UKÄ)
- Computer Science