The Monte Carlo method applied to carrier transport in Si/SiGe quantum wells

Valeria Vettchinkina, Anders Blom, M A Odnoblyudov

Research output: Contribution to journalArticlepeer-review

Abstract

We present a complete Monte Carlo simulation of the transport properties of a Si/SiGe quantum well. The scattering mechanisms, viz. intervalley phonons, acoustic phonons, interface roughness and impurity scattering (including resonant scattering), are considered in detail, and we derive analytic expressions for the scattering rates, in each case properly taking the quantized electron wave functions into account. The numerically obtained distribution function is used to discuss the influence of each scattering mechanism for different electric fields applied parallel to the interfaces and also different temperatures.
Original languageEnglish
Pages (from-to)3353-3377
JournalInternational Journal of Modern Physics B
Volume19
Issue number21
DOIs
Publication statusPublished - 2005

Bibliographical note

The information about affiliations in this record was updated in December 2015.
The record was previously connected to the following departments: Mathematical Physics (Faculty of Technology) (011040002), Department of Physics (011013000)

Subject classification (UKÄ)

  • Physical Sciences

Free keywords

  • distribution function
  • electron transport
  • quantum well
  • Monte Carlo method
  • SiGe
  • scattering
  • two-dimensional electron gas

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