Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)

S. A. Krasnikov, Alexei Preobrajenski, T. Chasse, R. Szargan

Research output: Contribution to journal › Article › peer-review

Subject classification (UKÄ)

@article{e1c5484e218843fa92a8c9a6e4aa95c4,

title = "Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)",

author = "Krasnikov, {S. A.} and Alexei Preobrajenski and T. Chasse and R. Szargan",

year = "2003",

language = "English",

volume = "428",

pages = "201--205",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

}