Ultrathin (1x2)-Sn layer on GaAs(100) and InAs(100) substrates: A catalyst for removal of amorphous surface oxides

P. Laukkanen, M. P. J. Punkkinen, J. Lang, M. Tuominen, M. Kuzmin, V. Tuominen, J. Dahl, Johan Adell, Janusz Sadowski, J. Kanski, V. Polojarvi, J. Pakarinen, K. Kokko, M. Guina, M. Pessa, I. J. Vayrynen

Research output: Contribution to journalArticlepeer-review

Abstract

Amorphous surface oxides of III-V semiconductors are harmful in many contexts of device development. Using low-energy electron diffraction and photoelectron spectroscopy, we demonstrate that surface oxides formed at Sn-capped GaAs(100) and InAs(100) surfaces in air are effectively removed by heating. This Sn-mediated oxide desorption procedure results in the initial well-defined Sn-stabilized (1x2) surface even for samples exposed to air for a prolonged time. Based on ab initio calculations we propose that the phenomenon is due to indirect and direct effects of Sn. The Sn-induced surface composition weakens oxygen adsorption. (C) 2011 American Institute of Physics. [doi:10.1063/1.3596702]
Original languageEnglish
Article number231908
JournalApplied Physics Letters
Volume98
Issue number23
DOIs
Publication statusPublished - 2011

Subject classification (UKÄ)

  • Natural Sciences
  • Physical Sciences

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