Abstract
Amorphous surface oxides of III-V semiconductors are harmful in many contexts of device development. Using low-energy electron diffraction and photoelectron spectroscopy, we demonstrate that surface oxides formed at Sn-capped GaAs(100) and InAs(100) surfaces in air are effectively removed by heating. This Sn-mediated oxide desorption procedure results in the initial well-defined Sn-stabilized (1x2) surface even for samples exposed to air for a prolonged time. Based on ab initio calculations we propose that the phenomenon is due to indirect and direct effects of Sn. The Sn-induced surface composition weakens oxygen adsorption. (C) 2011 American Institute of Physics. [doi:10.1063/1.3596702]
| Original language | English |
|---|---|
| Article number | 231908 |
| Journal | Applied Physics Letters |
| Volume | 98 |
| Issue number | 23 |
| DOIs | |
| Publication status | Published - 2011 |
Subject classification (UKÄ)
- Natural Sciences
- Physical Sciences
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