Unveiling nano-scale chemical inhomogeneity in surface oxide films formed on V- and N-containing martensite stainless steel by synchrotron X-ray photoelectron emission spectroscopy/microscopy and microscopic X-ray absorption spectroscopy

Xiaoqi Yue, Dihao Chen, Anantha Krishnan, Isac Lazar, Yuran Niu, Evangelos Golias, Carsten Wiemann, Andrei Gloskovskii, Christoph Schlueter, Arno Jeromin, Thomas F. Keller, Haijie Tong, Sebastian Ejnermark, Jinshan Pan

Research output: Contribution to journalArticlepeer-review

Abstract

Nano-scale chemical inhomogeneity in surface oxide films formed on a V- and N-containing martensite stainless steel and tempering heating induced changes are investigated by a combination of synchrotron- based hard X-ray Photoelectron emission spectroscopy (HAXPES) and microscopy (HAXPEEM) as well as microscopic X-ray absorption spectroscopy (μ-XAS) techniques. The results reveal the inhomogeneity in the oxide films on the micron-sized Cr2N- and VN-type particles, while the inhomogeneity on the martensite matrix phase exists due to localised formation of nano-sized tempering nitride particles at 600 °C. The oxide film formed on Cr2N-type particles is rich in Cr2O3 compared with that on the martensite matrix and VN-type particles. With the increase of tempering temperature, Cr2O3 formation is faster for the oxidation of Cr in the martensite matrix than the oxidation of Cr nitride-rich particles.

Original languageEnglish
Pages (from-to)191-203
Number of pages13
JournalJournal of Materials Science and Technology
Volume205
DOIs
Publication statusPublished - 2025

Subject classification (UKÄ)

  • Materials Chemistry

Free keywords

  • Hard X-ray photoelectron emission spectroscopy
  • Martensite stainless steel
  • Surface oxide film
  • Synchrotron microscopic X-ray absorption spectroscopy
  • Synchrotron X-ray photoelectron emission microscopy

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