What one can learn about clusters using the unique tools of x-ray photoelectron spectroscopy

Maxim Tchaplyguine, Tomas Andersson, Chaofan Zhang, Mikko-Heikki Mikkela, Leena Partanen, Marko Huttula, Kari Jankala, Gunnar Öhrwall, Svante Svensson, Nils Mårtensson, Olle Björneholm

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

This presentation is intended to illustrate various types of collisional processes relevant for free clusters probed by x-ray photoelectron spectroscopy using our own examples ranging from free-electron-metal clusters, through half-metal and semiconductor clusters to dielectrics, the latter from van-der-Waals to ionic clusters.
Original languageEnglish
Title of host publicationXXVII International Conference on Photonic, Electronic and Atomic Collisions (Icpeac 2011), Pts 1-15
PublisherIOP Publishing
Pages152025
Volume388
DOIs
Publication statusPublished - 2012
Event27th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC) - Belfast, North Ireland, Ireland
Duration: 2011 Jul 272011 Aug 2

Publication series

Name
Volume388
ISSN (Print)1742-6596
ISSN (Electronic)1742-6588

Conference

Conference27th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC)
Country/TerritoryIreland
Period2011/07/272011/08/02

Subject classification (UKÄ)

  • Physical Sciences
  • Natural Sciences

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