X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

Thomas B Johansson; Roland Akselsson; Sven A E Johansson

doi:10.1016/0029-554X(70)90751-2

X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

Thomas B Johansson, Roland Akselsson, Sven A E Johansson

Research output: Contribution to journal › Article › peer-review

Abstract

Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.

Original language	English
Pages (from-to)	141-143
Journal	Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume	84
Issue number	1
DOIs	https://doi.org/10.1016/0029-554X(70)90751-2
Publication status	Published - 1970

Bibliographical note

The information about affiliations in this record was updated in December 2015.
The record was previously connected to the following departments: Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)

Subject classification (UKÄ)

Subatomic Physics
Production Engineering, Human Work Science and Ergonomics

Free keywords

PIXE
particle induced X-ray emission analysis
trace element analysis

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10.1016/0029-554X(70)90751-2

Cite this

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title = "X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level",

abstract = "Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.",

keywords = "PIXE, particle induced X-ray emission analysis, trace element analysis",

author = "Johansson, {Thomas B} and Roland Akselsson and Johansson, {Sven A E}",

note = "The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)",

year = "1970",

doi = "10.1016/0029-554X(70)90751-2",

language = "English",

volume = "84",

pages = "141--143",

journal = "Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment",

issn = "0167-5087",

publisher = "Elsevier",

number = "1",

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T1 - X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

AU - Johansson, Thomas B

AU - Akselsson, Roland

AU - Johansson, Sven A E

N1 - The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)

PY - 1970

Y1 - 1970

N2 - Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.

AB - Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.

KW - PIXE

KW - particle induced X-ray emission analysis

KW - trace element analysis

U2 - 10.1016/0029-554X(70)90751-2

DO - 10.1016/0029-554X(70)90751-2

M3 - Article

SN - 0167-5087

VL - 84

SP - 141

EP - 143

JO - Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

JF - Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

IS - 1

ER -

X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

Abstract

Bibliographical note

Subject classification (UKÄ)

Free keywords

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