X-ray photoelectron diffraction investigation of the cleavage plane in IT-transition metal dichalcogenides

D. Stoltz, Sven Stoltz

Research output: Contribution to journalArticlepeer-review

2 Citations (SciVal)

Abstract

We present a detailed study of the three members of the 1 T-transition metal dichalcogenides: TiSe2, TaSe2 and TaS2 by means of the X-ray photoelectron diffraction combined with single-scattering simulations. Our simulations of different surface terminations and their comparison with the measured diffraction patterns allow to determine that the cleavage occurs within the van der Waals gap. Singlescattering calculations are shown to simulate very well the measured diffractograms on these compounds. (c) 2007 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)172-177
JournalPhysica B: Condensed Matter
Volume398
Issue number1
DOIs
Publication statusPublished - 2007

Subject classification (UKÄ)

  • Natural Sciences
  • Physical Sciences

Keywords

  • surfaces
  • surface structure
  • single crystal
  • computer simulations
  • X-ray diffraction
  • scattering

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