X-ray photoelectron spectroscopy of low surface concentration mass-selected Ag clusters

James N. O'Shea, Joachim Schnadt, Staffan Andersson, Luc Patthey, Steffen Rost, Annika Giertz, Barbara Brena, Jan Olof Forsell, Anders Sandell, Olle Björneholm, Paul A. Brühwiler, Nils Mårtensson

Research output: Contribution to journalArticlepeer-review

Abstract

Low surface concentrations of mass-selected clusters deposited under ultra high vacuum conditions on a well-characterized surface were studied with XPS. Analysis of monomers and dimers deposited at low temperature in a thick Xe buffer layer indicates the mobility and aggregation of the clusters in such a film. A stable average cluster size is reached at 53 K that is likely to be the same for all initially deposited cluster sizes studied in the range Ag1-Ag5. Cluster aggregation progresses as the temperature is raised, tending toward the formation of metallic islands at high temperatures.

Original languageEnglish
Pages (from-to)9233-9238
Number of pages6
JournalJournal of Chemical Physics
Volume113
Issue number20
DOIs
Publication statusPublished - 2000 Nov 1
Externally publishedYes

Fingerprint

Dive into the research topics of 'X-ray photoelectron spectroscopy of low surface concentration mass-selected Ag clusters'. Together they form a unique fingerprint.

Cite this