XUV interferometry using high-order harmonics: Application to plasma diagnostics

JF Hergott, P Salieres, H Merdji, L Le Deroff, B Carre, T Auguste, P Monot, P D'Oliveira, D Descamps, Johan Norin, C Lyngå, Anne L'Huillier, Claes-Göran Wahlström, M Bellini, S Huller

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Abstract

In this paper, we present and compare the two different XUV interferometric techniques using high-order harmonics that have been developed so far. The first scheme is based on the interference between two spatially separated phase-locked harmonic sources while the second uses two temporally separated harmonic sources. These techniques have been applied to plasma diagnostics in feasibility experiments where electron densities up to a few 1020 e[minus sign/cm3 have been measured with a temporal resolution of 200 fs. We present the main characteristics of each technique and discuss their respective potentials and limitations.
Original languageEnglish
Pages (from-to)35-40
JournalLaser and Particle Beams
Volume19
Issue number1
DOIs
Publication statusPublished - 2001

Subject classification (UKÄ)

  • Atom and Molecular Physics and Optics

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