Erik Larsson

Professor, PhD
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  1. 2020
  2. IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks

    Erik Larsson, Xiang, Z. & Murali, P., 2020 May 26, (Accepted/In press) 25th IEEE European Test Symposium. Institute of Electrical and Electronics Engineers Inc., p. 1-2 2 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  3. 2019
  4. Functional port for accessing on-chip instruments

    Erik Larsson, 2019 Nov 27.

    Research output: Contribution to conferencePaper, not in proceeding

  5. Maintainability of large-scale IoT

    Erik Larsson, 2019 Oct 31.

    Research output: Contribution to conferencePaper, not in proceeding

  6. IEEE Std. P1687.1: Access to IEEE Std. 1687 via UART

    Erik Larsson, Murali, P. & Kumisbek, G., 2019, (Accepted/In press).

    Research output: Contribution to conferencePaper, not in proceeding

  7. IEEE Std. P1687.1: translator and protocol

    Erik Larsson, Murali, P. & Kumisbek, G., 2019, International Test Conference. Institute of Electrical and Electronics Engineers Inc.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  8. Test Flow Selection for Stacked Integrated Circuits

    Breeta SenGupta, Nikolov, D., Dash, A. & Erik Larsson, 2019, In : Journal of Electronic Testing: Theory and Applications (JETTA). 35, 4, p. 425-440

    Research output: Contribution to journalArticle

  9. 2018
  10. Systemkretsar ställer nya krav på testningen

    Erik Larsson, 2018 Aug, Elektroniktidningen, 7-8/2018, p. 14 15 p.

    Research output: Contribution to specialist publication or newspaperNewspaper article

  11. On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks

    Ghani Zadegan, F., Nikolov, D. & Erik Larsson, 2018 Feb 1, In : IEEE Transactions on Computers. 67, 2, p. 237-251

    Research output: Contribution to journalArticle

  12. Test of Reconfigurable Modules in Scan Networks

    Cantoro, R., Ghani Zadegan, F., Palena, M., Pasini, P., Erik Larsson & Sonza Reorda, M., 2018, In : IEEE Transactions on Computers. 67, 12, p. 1806-1817

    Research output: Contribution to journalArticle

  13. 2017
  14. Clustered checkpointing: Maximizing the level of confidence for non-equidistant checkpointing

    Nikolov, D. & Erik Larsson, 2017 Jun, In : Integration, the VLSI Journal. 58, p. 549-562

    Research output: Contribution to journalArticle

  15. BASTION: Board and SoC test instrumentation for ageing and no failure found

    Jutman, A., Lotz, C., Erik Larsson, Sonza Reorda, M., Jenihhin, M., Raik, J., Kerkhoff, H., Krenz-Baath, R. & Engelke, P., 2017 Mar, 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE). Institute of Electrical and Electronics Engineers Inc., p. 115-120 ( Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online)).

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  16. Test Planning for Core-based Integrated Circuits under Power Constraints

    Breeta SenGupta, Nikolov, D., Ingelsson, U. & Erik Larsson, 2017 Feb 1, In : Journal of Electronic Testing: Theory and Applications (JETTA). 33, 1, p. 7-23 17 p.

    Research output: Contribution to journalArticle

  17. Fault Extraction in Self-Reconfiguring IEEE 1687 Networks

    Ghani Zadegan, F., Nikolov, D. & Erik Larsson, 2017, (Unpublished).

    Research output: Contribution to conferencePaper, not in proceeding

  18. Reducing Pessimism in Upper-Bound Computation for Optimal IEEE 1687 Retargeting

    Ghani Zadegan, F., Krenz-Baath, R. & Erik Larsson, 2017.

    Research output: Contribution to conferencePaper, not in proceeding

  19. 2016
  20. Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks

    Cantoro, R., Montazeri, M., Sonza, M., Ghani Zadegan, F. & Erik Larsson, 2016 Oct 20, 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016. Institute of Electrical and Electronics Engineers Inc., p. 167-172 6 p. 7604692

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  21. In-Field System-Health Monitoring Based on IEEE 1687

    Erik Larsson, Ghani Zadegan, F. & Nikolov, D., 2016 Sep 6, Proceedings - 29th IEEE International System on Chip Conference, SOCC 2016. IEEE Computer Society, p. 69-74 6 p. 7905437

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  22. Compressor design for silicon debug

    Zhang, J., Fritz, L. J., Liang Liu & Erik Larsson, 2016 Jul 22, Proceedings - 2016 21st IEEE European Test Symposium, ETS 2016. Institute of Electrical and Electronics Engineers Inc., 7519281

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  23. On the diagnostic analysis of IEEE 1687 networks

    Cantoro, R., Montazeri, M., Reorda, M. S., Zadegan, F. G. & E. Larsson, 2016 Jul 22, Proceedings - 2016 21st IEEE European Test Symposium, ETS 2016. Institute of Electrical and Electronics Engineers Inc., 7519294

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  24. Accessing On-chip Instruments Through the Life-time of Systems

    Erik Larsson & Ghani Zadegan, F., 2016 Jun 1, LATS 2016 - 17th IEEE Latin-American Test Symposium. Institute of Electrical and Electronics Engineers Inc., p. 2-4 3 p. 7483327

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  25. Retargeting Challenges in IEEE 1687 Networks

    Ghani Zadegan, F., Krenz-Baath, R., Erik Larsson & Jutman, A., 2016 May 26, (Unpublished).

    Research output: Contribution to conferencePaper, not in proceeding

  26. Test, Validation and Diagnosis of IEEE 1687 Networks

    Cantoro, R., Sonza-Reorda, M., Ghani Zadegan, F., Erik Larsson, Jutman, A. & Devadze, S., 2016 May 26, (Unpublished).

    Research output: Contribution to conferencePaper, not in proceeding

  27. Towards a Suite of IEEE 1687 Benchmark Networks

    Tsertov, A., Jutman, A., Devadze, S., Sonza-Reorda, M., Erik Larsson, Krenz-Baath, R., Ghani Zadegan, F. & Cantoro, R., 2016 May 26, (Unpublished).

    Research output: Contribution to conferencePaper, not in proceeding

  28. Maximizing level of confidence for non-equidistant Checkpointing

    Nikolov, D. & Erik Larsson, 2016 Mar 7, 2016 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016. Institute of Electrical and Electronics Engineers Inc., Vol. 25-28-January-2016. p. 62-68 7 p. 7427990

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  29. A Self-Reconfiguring IEEE 1687 Network for Fault Monitoring

    Ghani Zadegan, F., Nikolov, D. & Erik Larsson, 2016, 21th IEEE European Test Symposium (ETS), 2016. IEEE - Institute of Electrical and Electronics Engineers Inc., 6 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  30. Maximizing Level of Confidence for Non-Equidistant Checkpointing

    Nikolov, D. & Erik Larsson, 2016, (Accepted/In press).

    Research output: Contribution to conferencePaper, not in proceeding

  31. On the Testability of IEEE 1687 Networks

    Cantoro, R., Montazeri, M., Sonza Reorda, M., Ghani Zadegan, F. & Erik Larsson, 2016, 2015 IEEE 24th Asian Test Symposium (ATS). IEEE - Institute of Electrical and Electronics Engineers Inc., p. 211-216 6 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  32. Optimizing the Level of Confidence for Multiple Jobs

    Nikolov, D. & Erik Larsson, 2016, In : IEEE Transactions on Computers.

    Research output: Contribution to journalArticle

  33. Upper-bound computation for optimal retargeting in IEEE1687 networks

    Ghani Zadegan, F., Krenz-Baath, R. & Erik Larsson, 2016, 2016 IEEE International Test Conference (ITC). IEEE - Institute of Electrical and Electronics Engineers Inc., p. 1-10 10 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  34. 2015
  35. Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption

    Ingelsson, U., Kumar Goel, S., Erik Larsson & Marinissen, E. J., 2015, In : IEEE Transactions on Computers. 64, 12, p. 3335-3347

    Research output: Contribution to journalArticle

  36. Access Time Minimization in IEEE 1687 Networks

    Krenz-Baath, R., Ghani Zadegan, F. & Erik Larsson, 2015, [Host publication title missing]. IEEE - Institute of Electrical and Electronics Engineers Inc., p. 1-10 10 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  37. No Fault Found: The Root Cause

    Erik Larsson, Eklow, B., Davidsson, S., Aitken, R., Jutman, A. & Lotz, C., 2015, IEEE 33rd VLSI Test Symposium (VTS), 2015. IEEE - Institute of Electrical and Electronics Engineers Inc., 1 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  38. 2014
  39. Design, Verification and Application of IEEE 1687

    Ghani Zadegan, F., Erik Larsson, Jutman, A., Devadze, S. & Krenz-Baath, R., 2014, [Host publication title missing]. IEEE - Institute of Electrical and Electronics Engineers Inc., p. 93-100 8 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  40. Evaluation of Level of Confidence and Optimization of Roll-back Recovery with Checkpointing for Real-Time Systems

    Nikolov, D., Ingelsson, U., Singh, V. & Erik Larsson, 2014, In : Microelectronics and Reliability. 54, 5, p. 1022-1049

    Research output: Contribution to journalArticle

  41. Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687

    Petersen, K., Nikolov, D., Ingelsson, U., Carlsson, G., Ghani Zadegan, F. & Erik Larsson, 2014, 2014 IEEE 20th International On-Line Testing Symposium (IOLTS). IEEE - Institute of Electrical and Electronics Engineers Inc.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  42. Robustness of TAP-based Scan Networks

    Ghani Zadegan, F., Carlsson, G. & Erik Larsson, 2014, [Host publication title missing]. 10 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  43. Test Planning and Test Access Mechanism Design for 3D SICs

    Breeta Sengupta & Erik Larsson, 2014, [Host publication title missing]. Swedish System on Chip Conference (SSoCC), 6 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  44. Test Planning and Test Access Mechanism Design for Stacked Chips using ILP

    Breeta Sengupta & Erik Larsson, 2014, VLSI Test Symposium (VTS), 2014 IEEE 32nd. IEEE - Institute of Electrical and Electronics Engineers Inc., p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  45. 2013
  46. Embedded DfT Instrumentation: Design, Access, Retargeting and Case Studies

    Erik Larsson & Keim, M., 2013, [Host publication title missing]. IEEE - Institute of Electrical and Electronics Engineers Inc., 2 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  47. Scenario-Based Network Design for P1687

    Ghani Zadegan, F., Carlsson, G. & Erik Larsson, 2013.

    Research output: Contribution to conferencePaper, not in proceeding

  48. Test Planning for 3D SICs using ILP

    Breeta Sengupta & Erik Larsson, 2013. 8 p.

    Research output: Contribution to conferencePaper, not in proceeding

  49. 2012
  50. Accessing Embedded DfT Instruments with IEEE P1687

    Erik Larsson & Ghani Zadegan, F., 2012, IEEE 21st Asian Test Symposium (ATS), 2012. IEEE - Institute of Electrical and Electronics Engineers Inc., p. 71-76

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  51. Access Time Analysis for IEEE P1687

    Ghani Zadegan, F., Ingelsson, U., Carlsson, G. & Erik Larsson, 2012, In : IEEE Transactions on Computers. 61, 10, p. 1459-1472

    Research output: Contribution to journalArticle

  52. An MPSoCs demonstrator for fault injection and fault handling in an IEEE P1687 environment

    Petersen, K., Nikolov, D., Ingelsson, U., Carlsson, G. & Erik Larsson, 2012.

    Research output: Contribution to conferencePaper, not in proceeding

  53. Fault management in an IEEE P1687 (IJTAG) environment

    Erik Larsson & Shibin, K., 2012, [Host publication title missing]. IEEE - Institute of Electrical and Electronics Engineers Inc., p. 7-7 1 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  54. Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687

    Ghani Zadegan, F., Ingelsson, U., Carlsson, G. & Erik Larsson, 2012, In : IEEE Design and Test of Computers. 29, 2, p. 79-88

    Research output: Contribution to journalArticle

  55. Re-using Chip Level DFT at Board Level

    Gu, X., Rearick, J., Eklow, B., Qian, J., Jutman, A., Chakrabarty, K. & Erik Larsson, 2012, [Host publication title missing]. IEEE - Institute of Electrical and Electronics Engineers Inc., p. 205-205 1 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  56. Scheduling Tests for 3D Stacked Chips under Power Constraints

    Breeta Sengupta, Ingelsson, U. & Erik Larsson, 2012, In : Journal of Electronic Testing. 28, 1, p. 121-135

    Research output: Contribution to journalArticle

  57. Test Planning for Core-based 3D Stacked ICs under Power Constraints

    Breeta Sengupta, Ingelsson, U. & Erik Larsson, 2012.

    Research output: Contribution to conferencePaper, not in proceeding

  58. Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias

    Breeta Sengupta, Ingelsson, U. & Erik Larsson, 2012, [Host publication title missing]. IEEE - Institute of Electrical and Electronics Engineers Inc., p. 442-447 6 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

  59. 2011
  60. Adaptive Execution Assistance for Multiplexed Fault-Tolerant Chip Multiprocessors

    Subramanyan, P., Singh, V., Saluja, K. & Erik Larsson, 2011, 2011 IEEE 29th International Conference on Computer Design (ICCD). IEEE - Institute of Electrical and Electronics Engineers Inc., p. 419-426 8 p.

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

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