A comparative study of clean and Bi-stabilized InP(100)(2 x 4) surfaces by the core-level photoelectron spectroscopy

Research output: Contribution to journalArticle

Abstract

The bismuth-stabilized (2 x 4)-reconstructed InP(100) surface [Bi/InP(100)(2 x 4)] has been studied by synchrotron-radiation core-level photoelectron spectroscopy. The spectra are compared with previous core-level data obtained on a clean InP(100)(2 x 4) surface. The findings support that the P 2p surface-core-level shift (SCLS) of the clean InP(100)(2 x 4), which has higher kinetic energy than the bulk emission, arises from the third-layer P atoms and that the second P 2p SCLS, which has lower kinetic energy than the bulk, arises from the top-layer P atoms. Similar In 4d SCLSs are found on the clean and Bi-stabilized InP(100)(2 x 4) surfaces, indicating that these shifts contain contributions of the In atoms that lie in the second and/or fourth layers. In addition to this, the results improve our understanding of the atomic structure of the Bi/InP(100)(2 x 4) surface and lead to refined surface models which include Bi-Bi and Bi-P dimers. (C) 2007 Elsevier B.V. All rights reserved.

Details

Authors
  • P. Laukkanen
  • M. Ahola-Tuomi
  • Johan Adell
  • Martin Adell
  • K. Schulte
  • M. Kuzmin
  • M. P. J. Punkkinen
  • J. Pakarinen
  • A. Tukiainen
  • R. E. Perala
  • I. J. Vayrynen
  • M. Pessa
Organisations
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Physical Sciences
  • Natural Sciences

Keywords

  • synchrotron radiation photoelectron spectroscopy, (InP), indium phosphide, single crystal surfaces, surface reconstruction
Original languageEnglish
Pages (from-to)3395-3399
JournalSurface Science
Volume601
Issue number16
Publication statusPublished - 2007
Publication categoryResearch
Peer-reviewedYes