A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging https://orcid.org/0000-0003-1500-0831 Fevola Giovanni

Research output: Contribution to journalArticle

Abstract

Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave-based or hybrid X-ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating-like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase-retrieval algorithm. Potentials and limits of this approach are highlighted. It is suggested that it could be applied to study imperfect or non-standard CDI configurations lacking a satisfactory theoretical formulation. The considerable computational effort required by this method is justified by the great flexibility provided for easy simulation of a large-parameter space.

Details

Authors
  • Giovanni Fevola
  • Erik Bergback Knudsen
  • Tiago Ramos
  • Dina Carbone
  • Jens Wenzel Andreasen
Organisations
External organisations
  • Technical University of Denmark
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Other Physics Topics

Keywords

  • coherent diffractive imaging, Monte Carlo simulations, ptychography H2020 European Research Council 681881 Ministeriet for Forskning Innovation og Videregående Uddannelser 7005-000005B, ray tracing, X-ray microscopy
Original languageEnglish
Pages (from-to)134-145
Number of pages12
JournalJournal of Synchrotron Radiation
Volume27
Publication statusPublished - 2020
Publication categoryResearch
Peer-reviewedYes