An Even-Odd DFD Technique for Scan Chain Diagnosis

Research output: Contribution to conferencePaper, not in proceeding

Details

Authors
External organisations
  • External Organization - Unknown
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Electrical Engineering, Electronic Engineering, Information Engineering
Original languageEnglish
Publication statusPublished - 2009
Publication categoryResearch
Peer-reviewedYes
Externally publishedYes
EventWorkshop on RTL and High Level Testing (WRTLT) - Hongkong, China
Duration: 2009 Nov 272009 Nov 28

Conference

ConferenceWorkshop on RTL and High Level Testing (WRTLT)
CountryChina
CityHongkong
Period2009/11/272009/11/28