Beamline-induced chromium structure in carbon K-edge absorption spectra

Research output: Contribution to journalArticle

Abstract

We show that Cr subcoatings in beamline optical elements can introduce an additional structure in C K-edge X-ray absorption measurements, which somewhat resembles the well-known losses produced by carbon contamination. The photon throughput variations induced by Cr and C require different treatments when correcting absorption spectra. The potential difficulties in unravelling the two effects could be avoided with efficient filtration of higher-order light.

Details

Authors
  • J. Schnadt
  • J. Schiessling
  • J. N. O'Shea
  • L. Patthey
  • M. Shi
  • C. Puglia
  • Nils Mårtensson
  • P. A. Brühwiler
External organisations
  • Uppsala University
  • University of Nottingham
  • Paul Scherrer Institute
Research areas and keywords

Keywords

  • Beamline instrumentation, C K-edge, Cr subcoating, X-ray absorption spectroscopy, X-ray optics
Original languageEnglish
Pages (from-to)609-614
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume184
Issue number4
Publication statusPublished - 2001 Dec 1
Publication categoryResearch
Peer-reviewedYes
Externally publishedYes