Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire

Research output: Contribution to journalArticle

Abstract

Three-dimensional (3D) Bragg coherent x-ray diffractive imaging (CXDI) with a nanofocused beam was applied to quantitatively map the internal strain field of a single indium phosphide nanowire. The quantitative values of the strain were obtained by pre-characterization of the beam profile with transmission ptychography on a test sample. Our measurements revealed the 3D strain distribution in a region of 150 nm below the catalyst Au particle. We observed a slight gradient of the strain in the range of 0.6% along the [111] growth direction of the nanowire. We also determined the spatial resolution in our measurements to be about 10 nm in the direction perpendicular to the facets of the nanowire. The CXDI measurements were compared with the finite element method simulations and show a good agreement with our experimental results. The proposed approach can become an effective tool for in operando studies of the nanowires.

Details

Authors
Organisations
External organisations
  • German Electron Synchrotron (DESY)
  • University of Copenhagen
  • University of Potsdam
  • European XFEL GmbH
  • Dresden University of Technology
  • University of California, San Diego
  • National Research Nuclear University MEPhI
  • Tomsk Polytechnic University
  • Center for Free-Electron Laser Science
  • University of Hamburg
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Accelerator Physics and Instrumentation
  • Nano Technology

Keywords

  • Bragg coherent x-ray diffractive imaging, InP nanowires, strain field
Original languageEnglish
Article number064007
JournalJournal of Optics
Volume18
Issue number6
Publication statusPublished - 2016 Jun 1
Publication categoryResearch
Peer-reviewedYes