Characterization of the response function of a Si(Li) detector using an absorber technique
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The non-Gaussian response function of a Si(Li) detector has been measured for characteristic Kα X-rays in the energy interval 1.5-8.6 keV using an absorber technique. The method is based on the different response to an attenuating absorber placed in front of the detector for the detector tail as compared to fully absorbed photons in the same position in the spectrum. The shape of the tail of a Kα X-ray peak could be derived from three X-ray spectra acquired with different attenuating absorbers using the PIXE or XRF method for excitation of single element standards. The line shape function could be described by a full energy Gaussian, a shelf, an exponential and a Si-escape component. The results presented are in good agreement with previously reported response functions obtained in measurements of monochromatic X-rays. The results will be implemented in a computer program for evaluating micro-PIXE spectra.
|Research areas and keywords||
Subject classification (UKÄ) – MANDATORY
|Number of pages||7|
|Journal||Nuclear Inst. and Methods in Physics Research, B|
|Publication status||Published - 1989 Oct|