Electrical properties and logic function of multibranch junction structures

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Abstract

We report on room-temperature electrical measurements of multibranch junction (MBJ) devices made from a semiconductor heterostructure. We show that the MBJ devices exhibit an interesting electrical property. If the voltage output at one branch is measured as a function of the voltages inputs to all the other branches, the output voltage is determined predominately by the most negative, or the lowest, voltage applied. The property arises from the nature of the voltage-induced ballistic electron transport in the MBJ device, and can in general be observed in other nanoscale MBJ structures. We also demonstrate the realization of very compact multi-input logic gates with the MBJ structures.

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  • Condensed Matter Physics
Original languageEnglish
Article number253515
JournalApplied Physics Letters
Volume86
Issue number25
Publication statusPublished - 2005
Publication categoryResearch
Peer-reviewedYes