Electron microscopy study of single crystal BaZr0.9Y0.1O3-x films prepared by chemical solution deposition

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding


Single crystal thin films of 10% yttrium doped barium zirconate (BZY10) have been prepared using chemical solution deposition on magnesium oxide substrates and annealed at 800 or 1000 degrees C. A focused ion beam lift out technique was used to prepare thin (< 100 nm) specimens for transmission electron microscopy (TEM) analysis. A variety of TEM based techniques were used for characterization, including high resolution imaging, X-ray energy dispersive spectroscopy and energy filtered TEM. High resolution TEM imaging indicated a high quality single crystal film with an epitaxial cube on cube type interface between BZY10 and MgO. For the sample annealed 1000 degrees C, annular dark field imaging in scanning transmission electron microscopy (STEM) mode showed a layered pattern of lower intensity in the single crystal film. Energy filtered TEM thickness map together with scanning electron microscopy (SEM) indicate the pattern consists of partially repeating voids.


Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Chemical Sciences
Original languageEnglish
Title of host publicationECS Transactions
PublisherElectrochemical Society
Publication statusPublished - 2012
Publication categoryResearch
EventSymposium on Ionic and Mixed Conducting Ceramics 8 - Seattle, WA
Duration: 2012 May 62012 May 10

Publication series

ISSN (Print)1938-6737
ISSN (Electronic)1938-5862


ConferenceSymposium on Ionic and Mixed Conducting Ceramics 8

Bibliographic note

The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Polymer and Materials Chemistry (LTH) (011001041)